In Depth Analysis of Food Structures: Hyperspectral Subsurface Laser Scattering

Otto Højager Attermann Nielsen, Anders Lindbjerg Dahl, Rasmus Larsen, Flemming Møller, Frederik Donbæk Nielsen, Carsten L. Thomsen, Henrik Aanæs, Jens Michael Carstensen

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    Abstract

    In this paper we describe a computer vision system based on SLS (Subsurface Laser Scattering) for industrial food inspection. To ob- tain high and uniform quality, in for example dairy products like yoghurt and cheese, it is important to monitor the change in size and shape of microscopic particles over time. In this paper we demonstrate the use- fulness of our SLS system for characterizing food items. We use a laser source that can be tuned to any wavelength in the range of 455 nm - 1020 nm by applying an AOTF (Acousto-Optical Tunable Filter) to an optical beam generated by a SuperK (supercontinuum) laser system. In our experiments we show how the system can be used for discriminating dairy products with dierent structure and how the structural change of a foam can be monitored over time. Time stability of the system is essential for measurements over several hours, and we demonstrate the time stability by measuring the re ectance prole of an inorganic phan- tom. The SLS technique is a very promising technique for non-intrusive food inspection, especially for homogenous products where particle size and shape are important parameters.
    Original languageEnglish
    Title of host publicationScandinavian Workshop on Imaging Food Quality 2011 : Ystad, May 27, 2011 - Proceedings
    Number of pages98
    Place of PublicationKgs. Lyngby, Denmark
    PublisherTechnical University of Denmark
    Publication date2011
    Pages29-34
    Publication statusPublished - 2011
    EventScandinavian Workshop on Imaging Food Quality 2011 - Ystad, Sweden
    Duration: 27 May 201127 May 2011
    http://www2.imm.dtu.dk/projects/SWIFQ/

    Workshop

    WorkshopScandinavian Workshop on Imaging Food Quality 2011
    Country/TerritorySweden
    CityYstad
    Period27/05/201127/05/2011
    OtherHeld in conjunction with the Scandinavian Conference on Image Analysis (SCIA 2011)
    Internet address
    SeriesIMM-Technical Report-­2011
    Number15

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