Improving, characterizing and predicting the lifetime of organic photovoltaics: Topical Review

Suren A. Gevorgyan, Ilona Maria Heckler, Eva Bundgaard, Michael Corazza, Markus Hösel, Roar R. Søndergaard, Gisele Alves dos Reis Benatto, Mikkel Jørgensen, Frederik C Krebs

Research output: Contribution to journalJournal articleResearchpeer-review

779 Downloads (Pure)

Abstract

This review summarizes the recent progress in the stability and lifetime of organic photovoltaics (OPVs). In particular, recently proposed solutions to failure mechanisms in different layers of the device stack are discussed comprising both structural and chemical modifications. Upscaling is additionally discussed from the perspective of stability presenting the challenges associated with device packaging and edge protection. An important part of device stability studies is the characterization, and this review provides a short overview of the most advanced techniques for stability characterization reported recently. Lifetime testing and determination is another challenge in the field of organic solar cells and the final sections of this review discuss the testing protocols as well as the generic marker for device lifetime and the methodology for comparing all the lifetime landmarks in one common diagram. These tools were used to determine the baselines for OPV lifetime tested under different ageing conditions. Finally, the current status of lifetime for organic solar cells is presented and predictions are made for progress in the near future.
Original languageEnglish
Article number103001
JournalJournal of Physics D: Applied Physics
Volume50
Issue number10
Pages (from-to)1-35
ISSN0022-3727
DOIs
Publication statusPublished - 2017

Keywords

  • Organic photovoltaics
  • Lifetime
  • Stability
  • Degradation
  • Lifetime testing
  • Advanced characterization

Fingerprint

Dive into the research topics of 'Improving, characterizing and predicting the lifetime of organic photovoltaics: Topical Review'. Together they form a unique fingerprint.

Cite this