Improvement of chip design to reduce resonances in subgap regime of Josephson junctions

Tine Greibe, T. Bauch, C. Wilson, P. Delsing

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

Excess current peaks in the IV curves of SIS Josephson junctions have been observed by some groups [1-3]. These peaks have the shape of a resonance as a function of voltage. The resonances appear in the subgap regime of the junctions and the subgap current (leakage current) is concealed. The positions of the resonances do not change as a magnetic field is applied to the junctions, but their amplitude decreases when the supercurrent is suppressed. We have measured the subgap current of Al/AlO(x)/Al junctions and we show that these resonances are due to resonant modes in the chip design which are excited by the ac-Josephson effect. We present a chip design that decreases the amplitude of the resonances to a such degree that the subgap current is quantifiable.
Original languageEnglish
Title of host publication25th International Conference on Low Temperature Physics (LT25) : Part 5: Superconductivity
Number of pages4
Publication date2009
Article number052063
DOIs
Publication statusPublished - 2009
Externally publishedYes
Event25th International Conference on Low Temperature Physics (LT25) - Leiden Inst Phys, Kamerlingh Onnes Lab, Amsterdam, Netherlands
Duration: 6 Aug 200813 Aug 2008
Conference number: 25

Conference

Conference25th International Conference on Low Temperature Physics (LT25)
Number25
LocationLeiden Inst Phys, Kamerlingh Onnes Lab
CountryNetherlands
CityAmsterdam
Period06/08/200813/08/2008
SeriesJournal of Physics: Conference Series
Volume150
ISSN1742-6588

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