Improved droplet elongation model and value for surface tension of AuSi

Surface tension is crucial for nanowire vapor liquid solid (VLS) growth models and simulations of growth under external stimuli. A promising method involving imaging droplet deformation under an external electric field has previously been used to report the surface tension of the AuSi eutectic catalyst on Si-nanowires. However, simplified assumptions in this approach led to a significantly lower value than those previously reported. In this study, we re-analyze the same dataset using a comprehensive three-dimensional (3D) model that accurately represents the hexagonal cross-section of Si nanowires. This approach provides a corrected surface tension value of 0.74 ± 0.26 J m⁻² consistent with other findings in the literature, and notably higher than the previously reported value of 0.55 ± 0.1 J m⁻². Our result highlights the importance of precise geometric modeling in accurately determining surface tension and enhancing the reliability of nanowire growth simulations and eutectic alloy studies.