Abstract
We demonstrate and optically characterize silicon-on-insulator based nanophotonic devices fabricated by nanoimprint lithography. In our demonstration, we have realized ordinary and topology-optimized photonic
crystal waveguide structures. The topology-optimized structures require lateral pattern definition on a sub 30-nm scale in combination with a deep vertical silicon etch of the order of ~300 nm. The nanoimprint method offers a cost-efficient parallel fabrication process with state-of-the-art replication fidelity, comparable to direct electron beam writing.
Original language | English |
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Journal | Optics Express |
Volume | 15 |
Issue number | 3 |
Pages (from-to) | 1261-1266 |
ISSN | 1094-4087 |
DOIs | |
Publication status | Published - 2007 |