Abstract
It is demonstrated that rotational invariance and reflection symmetry of image classifiers lead to a reduction in the number of free parameters in the classifier. When used in adaptive detectors, e.g. neural networks, this may be used to decrease the number of training samples necessary to learn a given classification task, or to improve generalization of the neural network. Notably, the symmetrization of the detector does not compromise the ability to distinguish objects that break the symmetry. (C) 2000 Elsevier Science Ltd. All rights reserved.
Original language | English |
---|---|
Journal | Neural Networks |
Volume | 13 |
Issue number | 6 |
Pages (from-to) | 565-570 |
ISSN | 0893-6080 |
DOIs | |
Publication status | Published - 2000 |
Keywords
- symmetry
- reflection
- rotation
- detector
- classifier
- filter