Imaging on the Nanoscale with THz Time-Domain, Emission and Pump-Probe Microscopy

Pemille Klarskov, Anzela Pizzuto, Daniel M. Mittleman

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

We demonstrate an experimental platform based on an scattering-type scanning near-field optical microscope (s-SNOM) with the ability to perform Laser Terahertz Emission Microscopy (LTEM), Terahertz Time-Domain Imaging (THz-TDI) and optical-pump terahertz probe back-to-back in the same configuration. We illustrate this by imaging a metal-semiconductor interface with all three methods.

Original languageEnglish
Title of host publicationProceedings of 43rd International Conference on Infrared Millimeter and Terahertz Waves
Number of pages2
PublisherIEEE
Publication date25 Oct 2018
Article number8509949
ISBN (Electronic)9781538638095
DOIs
Publication statusPublished - 25 Oct 2018
Event43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018 - Nagoya, Japan
Duration: 9 Sep 201814 Sep 2018

Conference

Conference43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018
CountryJapan
CityNagoya
Period09/09/201814/09/2018
SponsorAdvantest Corporation, AmTechs Corporation, Menlo Systems GmbH, Nippo Precigion Co., Ltd., TeraMetrix, LLC

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