Imaging microstructural dynamics and strain fields in electro-active materials in situ with dark field x-ray microscopy

Jeppe Ormstrup*, Emil V. Østergaard, Carsten Detlefs, Ragnvald H. Mathiesen, Can Yildirim, Mustafacan Kutsal, Philip K. Cook, Yves Watier, Carlos Cosculluela, Hugh Simons

*Corresponding author for this work

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Engineering & Materials Science

Physics & Astronomy