Original language | English |
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Journal | Scanning Microscopy |
Volume | 6 |
Issue number | 1 |
Pages (from-to) | 115-121 |
ISSN | 0891-7035 |
Publication status | Published - 1992 |
Image processing procedures for analysis of electron back scattering patterns
N.C. Krieger Lassen, D. Juul Jensen, K. Conradsen
Research output: Contribution to journal › Journal article › Research › peer-review