Image processing procedures for analysis of electron back scattering patterns

N.C. Krieger Lassen, D. Juul Jensen, K. Conradsen

    Research output: Contribution to journalJournal articleResearchpeer-review

    Original languageEnglish
    JournalScanning Microscopy
    Volume6
    Pages (from-to)115-121
    ISSN0891-7035
    Publication statusPublished - 1992

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