Image Formation in Second-Harmonic Near-Field Microscopy

Sergey I. Bozhevolnyi, Valeri Z. Lozovski, Kjeld Pedersen, Jørn Märcher Hvam

Research output: Contribution to journalConference articleResearchpeer-review

Abstract

A macroscopic self-consistent approach that enables one to rigorously describe image formation in scanning near-field optical second-harmonic generation microscopy is developed. The self-consistent second-harmonic field is determined by taking into account both the linear and nonlinear contributions in the effective current, i.e., the currents generated by the self-consistent fields at the fundamental and second-harmonic frequencies. The self-consistent problem for both frequencies is solved exactly by use of the diagram technique adapted from quantum electrodynamics. Preliminary numerical results calculated for a rectangular object are presented and compared with experimental observations. It is demonstrated that the optical contrast and the spatial resolution are significantly better in the second-harmonic images than in the images obtained at the fundamental frequency.
Original languageEnglish
JournalPHYSICA STATUS SOLIDI A-APPLIED RESEARCH
Volume175
Issue number1
Pages (from-to)331-336
ISSN0031-8965
DOIs
Publication statusPublished - 1999
EventWorkshop on Surface and Interface Optics'99 - Sainte-Maxime, France
Duration: 4 May 19999 May 1999

Workshop

WorkshopWorkshop on Surface and Interface Optics'99
CountryFrance
CitySainte-Maxime
Period04/05/199909/05/1999

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