A macroscopic self-consistent approach that enables one to rigorously describe image formation in scanning near-field optical second-harmonic generation microscopy is developed. The self-consistent second-harmonic field is determined by taking into account both the linear and nonlinear contributions in the effective current, i.e., the currents generated by the self-consistent fields at the fundamental and second-harmonic frequencies. The self-consistent problem for both frequencies is solved exactly by use of the diagram technique adapted from quantum electrodynamics. Preliminary numerical results calculated for a rectangular object are presented and compared with experimental observations. It is demonstrated that the optical contrast and the spatial resolution are significantly better in the second-harmonic images than in the images obtained at the fundamental frequency.
|Journal||PHYSICA STATUS SOLIDI A-APPLIED RESEARCH|
|Publication status||Published - 1999|
|Event||Workshop on Surface and Interface Optics'99 - Sainte-Maxime, France|
Duration: 4 May 1999 → 9 May 1999
|Workshop||Workshop on Surface and Interface Optics'99|
|Period||04/05/1999 → 09/05/1999|
Bozhevolnyi, S. I., Lozovski, V. Z., Pedersen, K., & Hvam, J. M. (1999). Image Formation in Second-Harmonic Near-Field Microscopy. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 175(1), 331-336. https://doi.org/10.1002/(SICI)1521-396X(199909)175:1<331::AID-PSSA331>3.0.CO;2-1