IGR J17329-2731: Swift/XRT localization and characterization

E. Bozzo*, E. Kuulkers, A. Postel, V. Savchenko, C. Sanchez-Fernandez, R. Wijnands, K. Pottschmidt, V. Beckmann, A. Bodaghee, J. Chenevez

*Corresponding author for this work

Research output: Other contributionNet publication - Internet publicationResearch

Abstract

The new INTEGRAL transient IGR J17329-2731 (ATel #10644) was observed with Swift/XRT on 2017 August 16 from 2:26 to 2:45 UTC (effective exposure time 1 ks). A single faint X-ray source (0.07 cts/s) is detected by Swift/XRT within the positional uncertainty provided by INTEGRAL IBIS/ISGRI. The best position obtained from the on-line XRT data analysis tool is at RA, Dec (J2000.0) = 263.20952 deg, -27.50135 deg (the associated 90% confidence level uncertainty is 3.1 arcsec; Evans et al. 2009, MNRAS, 397, 1177). The XRT spectrum could be preliminarily characterized by an absorbed power-law model, providing indication of a high absorption column density (>1E23 cm^-2) and hard emission (power-law photon index ~0.2). The estimated X-ray flux in the 0.5-10 keV energy band is about 2.5E-11 erg/cm^2/s. We are grateful to the Swift planning team for the very rapid scheduling of the Swift ToO observation.
Original languageEnglish
Publication date16 Aug 2017
Publication statusPublished - 16 Aug 2017
SeriesThe Astronomer's telegram
NumberATel #10645

Keywords

  • Transient

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