Identifying individual subgrains in evolving deformation structures by high angular resolution X-ray diffraction

Christian Wejdemann; U. Lienert; Hans Bruun Nielsen; Wolfgang Pantleon

Identifying individual subgrains in evolving deformation structures by high angular resolution X-ray diffraction

Christian Wejdemann
, U. Lienert
, Hans Bruun Nielsen
, Wolfgang Pantleon

Argonne National Laboratory

Research output: Contribution to journal › Conference article › Research › peer-review

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Original language	English
Journal	Proceedings of the Risø International Symposium on Materials Science
Volume	31
Pages (from-to)	477-487
ISSN	0907-0079
Publication status	Published - 2010
Event	31st Risø International Symposium on Materials Science : Challenges in materials science and possibilities in 3D and 4D characterization techniques - Risø DTU, Roskilde, Denmark Duration: 6 Sept 2010 → 10 Sept 2010

Conference

Conference	31st Risø International Symposium on Materials Science : Challenges in materials science and possibilities in 3D and 4D characterization techniques
Location	Risø DTU
Country/Territory	Denmark
City	Roskilde
Period	06/09/2010 → 10/09/2010

Keywords

Materials characterization and modelling
Materials and energy storage

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Wejdemann IdentifyingFinal published version, 279 KB

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Cite this

@inproceedings{c3366f7ec45747f68320684e76184eac,

title = "Identifying individual subgrains in evolving deformation structures by high angular resolution X-ray diffraction",

keywords = "Materials characterization and modelling, Materials and energy storage, Materialekarakterisering og materialemodellering, Materialer og energilagring",

author = "Christian Wejdemann and U. Lienert and Nielsen, \{Hans Bruun\} and Wolfgang Pantleon",

year = "2010",

language = "English",

volume = "31",

pages = "477--487",

journal = "Proceedings of the Ris{\o} International Symposium on Materials Science",

issn = "0907-0079",

publisher = "Ris{\o} National Laboratory",

note = "31st Ris{\o} International Symposium on Materials Science : Challenges in materials science and possibilities in 3D and 4D characterization techniques ; Conference date: 06-09-2010 Through 10-09-2010",

}

Identifying individual subgrains in evolving deformation structures by high angular resolution X-ray diffraction. / Wejdemann, Christian; Lienert, U.; Nielsen, Hans Bruun et al.
In: Proceedings of the Risø International Symposium on Materials Science, Vol. 31, 2010, p. 477-487.

Research output: Contribution to journal › Conference article › Research › peer-review

TY - GEN

T1 - Identifying individual subgrains in evolving deformation structures by high angular resolution X-ray diffraction

AU - Wejdemann, Christian

AU - Lienert, U.

AU - Nielsen, Hans Bruun

AU - Pantleon, Wolfgang

PY - 2010

Y1 - 2010

KW - Materials characterization and modelling

KW - Materials and energy storage

KW - Materialekarakterisering og materialemodellering

KW - Materialer og energilagring

M3 - Conference article

SN - 0907-0079

VL - 31

SP - 477

EP - 487

JO - Proceedings of the Risø International Symposium on Materials Science

JF - Proceedings of the Risø International Symposium on Materials Science

T2 - 31st Risø International Symposium on Materials Science : Challenges in materials science and possibilities in 3D and 4D characterization techniques

Y2 - 6 September 2010 through 10 September 2010

ER -