TY - JOUR
T1 - Identification and imaging of modern paints using Secondary Ion Mass Spectrometry with MeV ions
AU - Bogdanović Radović, Iva
AU - Siketić, Zdravko
AU - Jembrih-Simbürger, Dubravka
AU - Marković, Nikola
AU - Anghelone, Marta
AU - Stoytschew, Valentin
AU - Jakšić, Milko
PY - 2017/9/1
Y1 - 2017/9/1
N2 - Secondary Ion Mass Spectrometry using MeV ion excitation was applied to analyse modern paint materials containing synthetic organic pigments and binders. It was demonstrated that synthetic organic pigments and binder components with molecular masses in the m/z range from 1 to 1200 could be identified in different paint samples with a high efficiency and in a single measurement. Different ways of mounting of mostly insulating paint samples were tested prior to the analysis in order to achieve the highest possible yield of pigment main molecular ions. As Time-of-Flight mass spectrometer for MeV Secondary Ion Mass Spectrometry is attached to the heavy ion microprobe, molecular imaging on cross-sections of small paint fragments was performed using focused ions. Due to the fact that molecules are extracted from the uppermost layer of the sample and to avoid surface contamination, the paint samples were not embedded in the resin as is usually done when imaging of paint samples using different techniques in the field of cultural heritage.
AB - Secondary Ion Mass Spectrometry using MeV ion excitation was applied to analyse modern paint materials containing synthetic organic pigments and binders. It was demonstrated that synthetic organic pigments and binder components with molecular masses in the m/z range from 1 to 1200 could be identified in different paint samples with a high efficiency and in a single measurement. Different ways of mounting of mostly insulating paint samples were tested prior to the analysis in order to achieve the highest possible yield of pigment main molecular ions. As Time-of-Flight mass spectrometer for MeV Secondary Ion Mass Spectrometry is attached to the heavy ion microprobe, molecular imaging on cross-sections of small paint fragments was performed using focused ions. Due to the fact that molecules are extracted from the uppermost layer of the sample and to avoid surface contamination, the paint samples were not embedded in the resin as is usually done when imaging of paint samples using different techniques in the field of cultural heritage.
KW - Heavy ion microprobe
KW - MeV-SIMS
KW - Modern paints
KW - Molecular imaging
KW - Synthetic organic pigments
U2 - 10.1016/j.nimb.2017.01.007
DO - 10.1016/j.nimb.2017.01.007
M3 - Journal article
AN - SCOPUS:85009291669
SN - 0168-583X
VL - 406
SP - 296
EP - 301
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
ER -