Identification and imaging of modern paints using Secondary Ion Mass Spectrometry with MeV ions

Iva Bogdanović Radović*, Zdravko Siketić, Dubravka Jembrih-Simbürger, Nikola Marković, Marta Anghelone, Valentin Stoytschew, Milko Jakšić

*Corresponding author for this work

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    Secondary Ion Mass Spectrometry using MeV ion excitation was applied to analyse modern paint materials containing synthetic organic pigments and binders. It was demonstrated that synthetic organic pigments and binder components with molecular masses in the m/z range from 1 to 1200 could be identified in different paint samples with a high efficiency and in a single measurement. Different ways of mounting of mostly insulating paint samples were tested prior to the analysis in order to achieve the highest possible yield of pigment main molecular ions. As Time-of-Flight mass spectrometer for MeV Secondary Ion Mass Spectrometry is attached to the heavy ion microprobe, molecular imaging on cross-sections of small paint fragments was performed using focused ions. Due to the fact that molecules are extracted from the uppermost layer of the sample and to avoid surface contamination, the paint samples were not embedded in the resin as is usually done when imaging of paint samples using different techniques in the field of cultural heritage.

    Original languageEnglish
    JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
    Volume406
    Pages (from-to)296-301
    Number of pages6
    ISSN0168-583X
    DOIs
    Publication statusPublished - 1 Sep 2017

    Keywords

    • Heavy ion microprobe
    • MeV-SIMS
    • Modern paints
    • Molecular imaging
    • Synthetic organic pigments

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