HVEM Studies of Void Formation in Cu-Ni Alloys

Bachu Narain Singh; Torben Leffers

HVEM Studies of Void Formation in Cu-Ni Alloys

Bachu Narain Singh
, Torben Leffers

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

Original language	English
Title of host publication	Proceedings of the 5th International Conference on High Voltage Electron Microscopy
Editors	T. Imura, H. Hashimoto
Number of pages	673
Place of Publication	Tokyo
Publisher	Japanese Society of Electron Microscopy
Publication date	1977
Edition	1
Pages	581-584
Publication status	Published - 1977
Event	5th International Conference on High Voltage Electron Microscopy - Kyoto, Japan Duration: 28 Aug 1977 → 31 Aug 1977 Conference number: 5

Conference

Conference	5th International Conference on High Voltage Electron Microscopy
Number	5
Country/Territory	Japan
City	Kyoto
Period	28/08/1977 → 31/08/1977

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Cite this

@inproceedings{e901b7954dec4dc2bbf2ea635cf7c2fb,

title = "HVEM Studies of Void Formation in Cu-Ni Alloys",

author = "Singh, \{Bachu Narain\} and Torben Leffers",

year = "1977",

language = "English",

pages = "581--584",

editor = "T. Imura and H. Hashimoto",

booktitle = "Proceedings of the 5th International Conference on High Voltage Electron Microscopy",

publisher = "Japanese Society of Electron Microscopy",

edition = "1",

note = "5th International Conference on High Voltage Electron Microscopy ; Conference date: 28-08-1977 Through 31-08-1977",

}

HVEM Studies of Void Formation in Cu-Ni Alloys. / Singh, Bachu Narain; Leffers, Torben.
Proceedings of the 5th International Conference on High Voltage Electron Microscopy. ed. / T. Imura; H. Hashimoto. 1. ed. Tokyo: Japanese Society of Electron Microscopy, 1977. p. 581-584.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

TY - GEN

T1 - HVEM Studies of Void Formation in Cu-Ni Alloys

AU - Singh, Bachu Narain

AU - Leffers, Torben

N1 - Conference code: 5

PY - 1977

Y1 - 1977

M3 - Article in proceedings

SP - 581

EP - 584

BT - Proceedings of the 5th International Conference on High Voltage Electron Microscopy

A2 - Imura, T.

A2 - Hashimoto, H.

PB - Japanese Society of Electron Microscopy

CY - Tokyo

T2 - 5th International Conference on High Voltage Electron Microscopy

Y2 - 28 August 1977 through 31 August 1977

ER -