Abstract
| Original language | English |
|---|---|
| Journal | Microelectronics Reliability |
| Volume | 82 |
| Pages (from-to) | 136-146 |
| ISSN | 0026-2714 |
| DOIs | |
| Publication status | Published - 2018 |
Keywords
- Acceleration factor
- Electronic devices
- Humidity
- RC simulation
- Reliability prediction
- Temperature
Cite this
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Humidity build-up in electronic enclosures exposed to different geographical locations by RC modelling and reliability prediction. / Conseil-Gudla, H.; Staliulionis, Z.; Mohanty, S.; Jellesen, M. S.; Hattel, J. H.; Ambat, R.
In: Microelectronics Reliability, Vol. 82, 2018, p. 136-146.Research output: Contribution to journal › Journal article › Research › peer-review
TY - JOUR
T1 - Humidity build-up in electronic enclosures exposed to different geographical locations by RC modelling and reliability prediction
AU - Conseil-Gudla, H.
AU - Staliulionis, Z.
AU - Mohanty, S.
AU - Jellesen, M. S.
AU - Hattel, J. H.
AU - Ambat, R.
PY - 2018
Y1 - 2018
N2 - Electronic devices are exposed to a wide range of climatic conditions. This study shows a reliability prediction of electronic devices exposed to different climates (from arid to humid and cold to hot regions). Temperature and humidity probability distribution functions have been calculated to indicate the change of climate exposure along year. While temperature and relative humidity (RH) are important factors in terms of water diffusion and electronic reliability, the internal climatic condition of 25 °C and 60% RH is widely used as threshold for electronic safety. Acceleration factors according to this steady state (25 °C and 60% RH) have been calculated for the different climates, and the protection offered by the enclosures has been estimated under different casing materials and resistor-capacitor (RC) simulation. This method offers a way to predict the average value of failure rate for electronic devices based on climate information and enclosure material.
AB - Electronic devices are exposed to a wide range of climatic conditions. This study shows a reliability prediction of electronic devices exposed to different climates (from arid to humid and cold to hot regions). Temperature and humidity probability distribution functions have been calculated to indicate the change of climate exposure along year. While temperature and relative humidity (RH) are important factors in terms of water diffusion and electronic reliability, the internal climatic condition of 25 °C and 60% RH is widely used as threshold for electronic safety. Acceleration factors according to this steady state (25 °C and 60% RH) have been calculated for the different climates, and the protection offered by the enclosures has been estimated under different casing materials and resistor-capacitor (RC) simulation. This method offers a way to predict the average value of failure rate for electronic devices based on climate information and enclosure material.
KW - Acceleration factor
KW - Electronic devices
KW - Humidity
KW - RC simulation
KW - Reliability prediction
KW - Temperature
U2 - 10.1016/j.microrel.2018.01.013
DO - 10.1016/j.microrel.2018.01.013
M3 - Journal article
VL - 82
SP - 136
EP - 146
JO - Microelectronics Reliability
JF - Microelectronics Reliability
SN - 0026-2714
ER -