Homogeneous linewidth of single InGaAs quantum dot photoluminescence

Kristjan Leosson; Wolfgang Langbein; Jacob Riis Jensen; Jørn Märcher Hvam

Homogeneous linewidth of single InGaAs quantum dot photoluminescence

Kristjan Leosson
, Wolfgang Langbein
, Jacob Riis Jensen
, Jørn Märcher Hvam

TU Dortmund University

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

Abstract

We have used m-photoluminescence spectroscopy with a spectral resolution of 20 meV to measure homogeneous linewidths of single emission lines within an inhomogeneously broadened ensemble of In0.5Ga0.5As/GaAs self-assembled quantum dots. At 10K, a distribution of linewidths peaking around 50 meV is found, which corresponds to a dephasing time of 26 ps. The shape of the linewidth distribution is similar for dots lying at the high and low-energy tail of the dot ensemble.

Original language	English
Title of host publication	Proceedings, Nonlinear Optics and Excitation Kinetics in Semiconductors (NOEKS-2000)
Publisher	Wiley-VCH
Publication date	2000
Publication status	Published - 2000
Event	6th International Workshop on Nonlinear Optics and Excitation Kinetics in Semiconductors - Marburg, Germany Duration: 10 Apr 2000 → 13 Apr 2000 Conference number: 6

Workshop

Workshop	6th International Workshop on Nonlinear Optics and Excitation Kinetics in Semiconductors
Number	6
Country/Territory	Germany
City	Marburg
Period	10/04/2000 → 13/04/2000

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@inproceedings{cd7ce88209b041d4beb33937a155c8de,

title = "Homogeneous linewidth of single InGaAs quantum dot photoluminescence",

abstract = "We have used m-photoluminescence spectroscopy with a spectral resolution of 20 meV to measure homogeneous linewidths of single emission lines within an inhomogeneously broadened ensemble of In0.5Ga0.5As/GaAs self-assembled quantum dots. At 10K, a distribution of linewidths peaking around 50 meV is found, which corresponds to a dephasing time of 26 ps. The shape of the linewidth distribution is similar for dots lying at the high and low-energy tail of the dot ensemble.",

author = "Kristjan Leosson and Wolfgang Langbein and Jensen, \{Jacob Riis\} and Hvam, \{J{\o}rn M{\"a}rcher\}",

year = "2000",

language = "English",

booktitle = "Proceedings, Nonlinear Optics and Excitation Kinetics in Semiconductors (NOEKS-2000)",

publisher = "Wiley-VCH",

address = "Germany",

note = "6th International Workshop on Nonlinear Optics and Excitation Kinetics in Semiconductors, NOEKS 2000 ; Conference date: 10-04-2000 Through 13-04-2000",

}

TY - GEN

T1 - Homogeneous linewidth of single InGaAs quantum dot photoluminescence

AU - Leosson, Kristjan

AU - Langbein, Wolfgang

AU - Jensen, Jacob Riis

AU - Hvam, Jørn Märcher

N1 - Conference code: 6

PY - 2000

Y1 - 2000

N2 - We have used m-photoluminescence spectroscopy with a spectral resolution of 20 meV to measure homogeneous linewidths of single emission lines within an inhomogeneously broadened ensemble of In0.5Ga0.5As/GaAs self-assembled quantum dots. At 10K, a distribution of linewidths peaking around 50 meV is found, which corresponds to a dephasing time of 26 ps. The shape of the linewidth distribution is similar for dots lying at the high and low-energy tail of the dot ensemble.

AB - We have used m-photoluminescence spectroscopy with a spectral resolution of 20 meV to measure homogeneous linewidths of single emission lines within an inhomogeneously broadened ensemble of In0.5Ga0.5As/GaAs self-assembled quantum dots. At 10K, a distribution of linewidths peaking around 50 meV is found, which corresponds to a dephasing time of 26 ps. The shape of the linewidth distribution is similar for dots lying at the high and low-energy tail of the dot ensemble.

M3 - Article in proceedings

BT - Proceedings, Nonlinear Optics and Excitation Kinetics in Semiconductors (NOEKS-2000)

PB - Wiley-VCH

T2 - 6th International Workshop on Nonlinear Optics and Excitation Kinetics in Semiconductors

Y2 - 10 April 2000 through 13 April 2000

ER -

Homogeneous linewidth of single InGaAs quantum dot photoluminescence

Abstract

Workshop

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