Hints to correct for skirt effects from plural scattering when doing EDS in a low-vacuum SEM

Jørgen Bilde-Sørensen

Research output: Contribution to journal › Journal article › Communication

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@article{b816e1b58aa042c8893e85cbc8edaa10,

title = "Hints to correct for skirt effects from plural scattering when doing EDS in a low-vacuum SEM",

keywords = "Industrielle materialer",

author = "J{\o}rgen Bilde-S{\o}rensen",

year = "1998",

language = "English",

pages = "28",

journal = "Microscopy Today",

issn = "2150-3583",

publisher = "Cambridge University Press",

number = "3",

}