High Throughput Characterization to Quantify Microstructural Heterogeneities in Additively Manufactured Haynes 282

Avantika Gupta; Sriram Vijayan; Olivia Schmid; Joerg Jinschek; Carolin Fink

doi:10.1017/S143192762200808X

High Throughput Characterization to Quantify Microstructural Heterogeneities in Additively Manufactured Haynes 282

Avantika Gupta
, Sriram Vijayan
, Olivia Schmid
, Joerg Jinschek
, Carolin Fink

Ohio State University

Research output: Contribution to journal › Conference abstract in journal › Research › peer-review

Original language	English
Journal	Microscopy and Microanalysis
Volume	28
Issue number	S1
Pages (from-to)	2088-2090
ISSN	1431-9276
DOIs	https://doi.org/10.1017/S143192762200808X
Publication status	Published - 2022
Event	Microscopy & Microanalysis 2022 - Portland, United States Duration: 31 Jul 2022 → 4 Aug 2022 https://www.microscopy.org/MandM/2022/

Conference

Conference	Microscopy & Microanalysis 2022
Country/Territory	United States
City	Portland
Period	31/07/2022 → 04/08/2022
Internet address	https://www.microscopy.org/MandM/2022/

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10.1017/S143192762200808X

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Cite this

@article{23b2528c71b54a6fb9cd6ec67efc58ae,

title = "High Throughput Characterization to Quantify Microstructural Heterogeneities in Additively Manufactured Haynes 282",

author = "Avantika Gupta and Sriram Vijayan and Olivia Schmid and Joerg Jinschek and Carolin Fink",

year = "2022",

doi = "10.1017/S143192762200808X",

language = "English",

volume = "28",

pages = "2088--2090",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "S1",

note = "Microscopy \& Microanalysis 2022 ; Conference date: 31-07-2022 Through 04-08-2022",

url = "https://www.microscopy.org/MandM/2022/",

}

TY - ABST

T1 - High Throughput Characterization to Quantify Microstructural Heterogeneities in Additively Manufactured Haynes 282

AU - Gupta, Avantika

AU - Vijayan, Sriram

AU - Schmid, Olivia

AU - Jinschek, Joerg

AU - Fink, Carolin

PY - 2022

Y1 - 2022

U2 - 10.1017/S143192762200808X

DO - 10.1017/S143192762200808X

M3 - Conference abstract in journal

SN - 1431-9276

VL - 28

SP - 2088

EP - 2090

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S1

T2 - Microscopy & Microanalysis 2022

Y2 - 31 July 2022 through 4 August 2022

ER -