High-Speed Wide-Field Imaging of Microcircuitry Using Nitrogen Vacancies in Diamond

James L. Webb*, Luca Troise, Nikolaj W. Hansen, Louise F. Frellsen, Christian Osterkamp, Fedor Jelezko, Steffen Jankuhn, Jan Meijer, Kirstine Berg-Sørensen, Jean François Perrier, Alexander Huck*, Ulrik Lund Andersen*

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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The ability to measure the passage of electrical current with high spatial and temporal resolution is vital for applications ranging from inspection of microscopic electronic circuits to biosensing. The ability to image such signals passively and remotely is of great importance, in order to measure without invasive disruption of the system under study or the signal itself. A recent approach to achieving this utilizes point defects in solid-state materials; in particular, nitrogen-vacancy centers in diamond. Acting as a high-density array of independent sensors, addressable opto-electronically and highly sensitive to factors including temperature and magnetic field, these are ideally suited to microscopic wide-field imaging. In this work, we demonstrate simultaneous spatially and temporally resolved recovery signals from a microscopic lithographically patterned circuit. Through application of a lock-in amplifier camera, we demonstrate micrometer-scale imaging resolution with a millimeter-scale field of view with simultaneous spatially resolved submillisecond (up to 3500 frames s-1) recovery of dc to kilohertz alternating and broadband pulsed-current electrical signals, without aliasing or undersampling. We demonstrate as examples of our method the recovery of synthetic signals replicating digital pulses in integrated circuits and signals that would be observed in a biological neuronal network in the brain.

Original languageEnglish
Article number064051
JournalPhysical Review Applied
Issue number6
Number of pages17
Publication statusPublished - 2022


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