High-resolution x-ray studies of an AXAF high-energy transmission grating

S. Abdali, Finn Erland Christensen, H. W. Schnopper, T. H. Markert

    Research output: Contribution to journalConference articleResearchpeer-review


    A triple axis X-ray diffractometer, designed and built at the Danish Space Research Institute, was used to make a high resolution study of the performance of a 2000 angstroms period, high energy X-ray transmission grating developed at MIT for one of the grating spectrometers on the Advanced X-ray Astrophysics Facility. Data was obtained at CuK(alpha )1 (8.048 keV) and, using single reflection asymmetric Si(044) crystals for both the monochromator and analyzer, an angular resolution of 1.5 arcsec FWHM was achieved. The efficiency of the grating in all orders up to the 15th was measured using a 12 kW rotating anode X-ray generator. These data provided the basis for a modelling of the grating structure.
    Original languageEnglish
    JournalProceedings of SPIE - The International Society for Optical Engineering
    Issue number2011
    Pages (from-to)2-11
    Publication statusPublished - 1993
    EventMultilayer and Grazing Incidence X-Ray/EUV Optics II - San Diego, CA, United States
    Duration: 14 Jul 199316 Jul 1993


    ConferenceMultilayer and Grazing Incidence X-Ray/EUV Optics II
    Country/TerritoryUnited States
    CitySan Diego, CA


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