High-resolution x-ray studies of an AXAF high-energy transmission grating

S. Abdali, Finn Erland Christensen, H. W. Schnopper, T. H. Markert

Research output: Contribution to journalConference articleResearchpeer-review


A triple axis X-ray diffractometer, designed and built at the Danish Space Research Institute, was used to make a high resolution study of the performance of a 2000 angstroms period, high energy X-ray transmission grating developed at MIT for one of the grating spectrometers on the Advanced X-ray Astrophysics Facility. Data was obtained at CuK(alpha )1 (8.048 keV) and, using single reflection asymmetric Si(044) crystals for both the monochromator and analyzer, an angular resolution of 1.5 arcsec FWHM was achieved. The efficiency of the grating in all orders up to the 15th was measured using a 12 kW rotating anode X-ray generator. These data provided the basis for a modelling of the grating structure.
Original languageEnglish
JournalProceedings of SPIE, the International Society for Optical Engineering
Issue number2011
Pages (from-to)2-11
Publication statusPublished - 1993
EventMultilayer and Grazing Incidence X-Ray/EUV Optics II - San Diego, CA, United States
Duration: 14 Jul 199316 Jul 1993


ConferenceMultilayer and Grazing Incidence X-Ray/EUV Optics II
Country/TerritoryUnited States
CitySan Diego, CA


Dive into the research topics of 'High-resolution x-ray studies of an AXAF high-energy transmission grating'. Together they form a unique fingerprint.

Cite this