High-resolution x-ray studies of an AXAF high-energy transmission grating

S. Abdali; Finn Erland Christensen; H. W. Schnopper; T. H. Markert

doi:10.1117/12.167191

High-resolution x-ray studies of an AXAF high-energy transmission grating

S. Abdali, Finn Erland Christensen, H. W. Schnopper, T. H. Markert

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

A triple axis X-ray diffractometer, designed and built at the Danish Space Research Institute, was used to make a high resolution study of the performance of a 2000 angstroms period, high energy X-ray transmission grating developed at MIT for one of the grating spectrometers on the Advanced X-ray Astrophysics Facility. Data was obtained at CuK(alpha )1 (8.048 keV) and, using single reflection asymmetric Si(044) crystals for both the monochromator and analyzer, an angular resolution of 1.5 arcsec FWHM was achieved. The efficiency of the grating in all orders up to the 15th was measured using a 12 kW rotating anode X-ray generator. These data provided the basis for a modelling of the grating structure.

Original language	English
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Issue number	2011
Pages (from-to)	2-11
ISSN	0277-786X
DOIs	https://doi.org/10.1117/12.167191
Publication status	Published - 1993
Event	Multilayer and Grazing Incidence X-Ray/EUV Optics II - San Diego, CA, United States Duration: 14 Jul 1993 → 16 Jul 1993

Conference

Conference	Multilayer and Grazing Incidence X-Ray/EUV Optics II
Country/Territory	United States
City	San Diego, CA
Period	14/07/1993 → 16/07/1993

Access to Document

10.1117/12.167191

OpenUrl availability

Full text

Cite this

@inproceedings{dc450f445e984438b9b3ee7ddc3aed77,

title = "High-resolution x-ray studies of an AXAF high-energy transmission grating",

abstract = "A triple axis X-ray diffractometer, designed and built at the Danish Space Research Institute, was used to make a high resolution study of the performance of a 2000 angstroms period, high energy X-ray transmission grating developed at MIT for one of the grating spectrometers on the Advanced X-ray Astrophysics Facility. Data was obtained at CuK(alpha )1 (8.048 keV) and, using single reflection asymmetric Si(044) crystals for both the monochromator and analyzer, an angular resolution of 1.5 arcsec FWHM was achieved. The efficiency of the grating in all orders up to the 15th was measured using a 12 kW rotating anode X-ray generator. These data provided the basis for a modelling of the grating structure.",

author = "S. Abdali and Christensen, {Finn Erland} and Schnopper, {H. W.} and Markert, {T. H.}",

year = "1993",

doi = "10.1117/12.167191",

language = "English",

pages = "2--11",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "Society of Photo-Optical Instrumentation Engineers",

number = "2011",

note = "Multilayer and Grazing Incidence X-Ray/EUV Optics II ; Conference date: 14-07-1993 Through 16-07-1993",

}

TY - GEN

T1 - High-resolution x-ray studies of an AXAF high-energy transmission grating

AU - Abdali, S.

AU - Christensen, Finn Erland

AU - Schnopper, H. W.

AU - Markert, T. H.

PY - 1993

Y1 - 1993

N2 - A triple axis X-ray diffractometer, designed and built at the Danish Space Research Institute, was used to make a high resolution study of the performance of a 2000 angstroms period, high energy X-ray transmission grating developed at MIT for one of the grating spectrometers on the Advanced X-ray Astrophysics Facility. Data was obtained at CuK(alpha )1 (8.048 keV) and, using single reflection asymmetric Si(044) crystals for both the monochromator and analyzer, an angular resolution of 1.5 arcsec FWHM was achieved. The efficiency of the grating in all orders up to the 15th was measured using a 12 kW rotating anode X-ray generator. These data provided the basis for a modelling of the grating structure.

AB - A triple axis X-ray diffractometer, designed and built at the Danish Space Research Institute, was used to make a high resolution study of the performance of a 2000 angstroms period, high energy X-ray transmission grating developed at MIT for one of the grating spectrometers on the Advanced X-ray Astrophysics Facility. Data was obtained at CuK(alpha )1 (8.048 keV) and, using single reflection asymmetric Si(044) crystals for both the monochromator and analyzer, an angular resolution of 1.5 arcsec FWHM was achieved. The efficiency of the grating in all orders up to the 15th was measured using a 12 kW rotating anode X-ray generator. These data provided the basis for a modelling of the grating structure.

U2 - 10.1117/12.167191

DO - 10.1117/12.167191

M3 - Conference article

SN - 0277-786X

SP - 2

EP - 11

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

IS - 2011

T2 - Multilayer and Grazing Incidence X-Ray/EUV Optics II

Y2 - 14 July 1993 through 16 July 1993

ER -

High-resolution x-ray studies of an AXAF high-energy transmission grating

Abstract

Conference

Access to Document

OpenUrl availability

Fingerprint

Cite this