High-resolution x-ray scatter and reflectivity study of sputtered IR surfaces

Finn Erland Christensen, S. Abdali, Allan Hornstrup, H. W. Schnopper

Research output: Contribution to journalConference articleResearchpeer-review


In recent years there has been an increased interest in the possible use of Ir as the reflecting surface in X-ray telescope programs. An X-ray study of such surfaces produced by sputtering of Ir on highly polished Zerodur flats is presented here. The study was performed using Fe K(alpha) 1 (6.404 Kev) and Cu K(alpha) 1 (8.048 keV) and includes measurement of total external reflection and scattering. The scattering measurement was made with three different instruments arrangements; one employed a 1D position sensitive detector for low resolution studies giving approximately 30 arcsec resolution (FWHM), and the other two arrangements employed channel cut crystals providing resolutions (FWHM) of 5 arcsec and 1 arcsec, respectively at Cu K(alpha) 1. The reflectivity study revealed a very close correspondence with a theoretical model based on recently published optical constants. This important result shows that an Ir coating can be produced with nominal bulk density.
Original languageEnglish
JournalProceedings of SPIE, the International Society for Optical Engineering
Issue number2011
Pages (from-to)18-33
Publication statusPublished - 1993
EventMultilayer and Grazing Incidence X-Ray/EUV Optics II - San Diego, CA, United States
Duration: 14 Jul 199316 Jul 1993


ConferenceMultilayer and Grazing Incidence X-Ray/EUV Optics II
Country/TerritoryUnited States
CitySan Diego, CA


Dive into the research topics of 'High-resolution x-ray scatter and reflectivity study of sputtered IR surfaces'. Together they form a unique fingerprint.

Cite this