High resolution STEM of quantum dots and quantum wires

Shima Kadkhodazadeh (Invited author)

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    This article reviews the application of high resolution scanning transmission electron microscopy (STEM) to semiconductor quantum dots (QDs) and quantum wires (QWRs). Different imaging and analytical techniques in STEM are introduced and key examples of their application to QDs and QWRs are presented. In addition, the benefits offered by aberration correction are discussed and an outlook for future developments of high resolution STEM analysis of QDs and QWRs is given.
    Original languageEnglish
    JournalMicron
    Volume44
    Pages (from-to)75-92
    ISSN0968-4328
    DOIs
    Publication statusPublished - 2013

    Keywords

    • Scanning transmission electron microscopy
    • Quantum dots
    • Quantum wires
    • High resolution
    • Aberration correction

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