High resolution STEM of quantum dots and quantum wires

Shima Kadkhodazadeh

doi:10.1016/j.micron.2012.10.004

High resolution STEM of quantum dots and quantum wires

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

This article reviews the application of high resolution scanning transmission electron microscopy (STEM) to semiconductor quantum dots (QDs) and quantum wires (QWRs). Different imaging and analytical techniques in STEM are introduced and key examples of their application to QDs and QWRs are presented. In addition, the benefits offered by aberration correction are discussed and an outlook for future developments of high resolution STEM analysis of QDs and QWRs is given.

Original language	English
Journal	Micron
Volume	44
Pages (from-to)	75-92
ISSN	0968-4328
DOIs	https://doi.org/10.1016/j.micron.2012.10.004
Publication status	Published - 2013

Keywords

Scanning transmission electron microscopy
Quantum dots
Quantum wires
High resolution
Aberration correction

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10.1016/j.micron.2012.10.004

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abstract = "This article reviews the application of high resolution scanning transmission electron microscopy (STEM) to semiconductor quantum dots (QDs) and quantum wires (QWRs). Different imaging and analytical techniques in STEM are introduced and key examples of their application to QDs and QWRs are presented. In addition, the benefits offered by aberration correction are discussed and an outlook for future developments of high resolution STEM analysis of QDs and QWRs is given.",

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KW - Scanning transmission electron microscopy

KW - Quantum dots

KW - Quantum wires

KW - High resolution

KW - Aberration correction

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High resolution STEM of quantum dots and quantum wires

Abstract

Keywords

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