High-resolution second-harmonic microscopy of poled silica waveguides

Jonas Beermann; Sergey I. Bozhevolnyi; Kjeld Pedersen; Jacob Fage Pedersen

High-resolution second-harmonic microscopy of poled silica waveguides

Jonas Beermann
, Sergey I. Bozhevolnyi
, Kjeld Pedersen
, Jacob Fage Pedersen

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

A second-harmonic scanning optical microscopy (SHSOM) apparatus operating in reflection is used for high-resolution imaging of second-order optical non-linearities (SONs) in electric-field poled silica-based waveguides. SHSOM of domain walls in a periodically poled KTiOPO4 crystal is performed, and the spatial resolution at the pump wavelength of 790 nm is determined to be better than 0.7 m. SHSOM images of positively poled silica waveguides were obtained for different polarization combinations of the incident pump beam and the detected second-harmonic radiation. Calibration of the SHSOM with a GaAs-sample indicates the presence of large (non-uniformly distributed) SONs of ~10 pm/V in the area of UV-written waveguides

Original language	English
Journal	Optics Communications
Volume	221
Issue number	4-6
Pages (from-to)	6
ISSN	0030-4018
Publication status	Published - 2003

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@article{be751fe9c3554611847c5206dcab67e5,

title = "High-resolution second-harmonic microscopy of poled silica waveguides",

abstract = "A second-harmonic scanning optical microscopy (SHSOM) apparatus operating in reflection is used for high-resolution imaging of second-order optical non-linearities (SONs) in electric-field poled silica-based waveguides. SHSOM of domain walls in a periodically poled KTiOPO4 crystal is performed, and the spatial resolution at the pump wavelength of 790 nm is determined to be better than 0.7 m. SHSOM images of positively poled silica waveguides were obtained for different polarization combinations of the incident pump beam and the detected second-harmonic radiation. Calibration of the SHSOM with a GaAs-sample indicates the presence of large (non-uniformly distributed) SONs of \textasciitilde{}10 pm/V in the area of UV-written waveguides",

keywords = "Scanning optical microscopy; Second-harmonic generation",

author = "Jonas Beermann and Bozhevolnyi, \{Sergey I.\} and Kjeld Pedersen and Pedersen, \{Jacob Fage\}",

year = "2003",

language = "English",

volume = "221",

pages = "6",

journal = "Optics Communications",

issn = "0030-4018",

publisher = "Elsevier",

number = "4-6",

}

TY - JOUR

T1 - High-resolution second-harmonic microscopy of poled silica waveguides

AU - Beermann, Jonas

AU - Bozhevolnyi, Sergey I.

AU - Pedersen, Kjeld

AU - Pedersen, Jacob Fage

PY - 2003

Y1 - 2003

N2 - A second-harmonic scanning optical microscopy (SHSOM) apparatus operating in reflection is used for high-resolution imaging of second-order optical non-linearities (SONs) in electric-field poled silica-based waveguides. SHSOM of domain walls in a periodically poled KTiOPO4 crystal is performed, and the spatial resolution at the pump wavelength of 790 nm is determined to be better than 0.7 m. SHSOM images of positively poled silica waveguides were obtained for different polarization combinations of the incident pump beam and the detected second-harmonic radiation. Calibration of the SHSOM with a GaAs-sample indicates the presence of large (non-uniformly distributed) SONs of ~10 pm/V in the area of UV-written waveguides

AB - A second-harmonic scanning optical microscopy (SHSOM) apparatus operating in reflection is used for high-resolution imaging of second-order optical non-linearities (SONs) in electric-field poled silica-based waveguides. SHSOM of domain walls in a periodically poled KTiOPO4 crystal is performed, and the spatial resolution at the pump wavelength of 790 nm is determined to be better than 0.7 m. SHSOM images of positively poled silica waveguides were obtained for different polarization combinations of the incident pump beam and the detected second-harmonic radiation. Calibration of the SHSOM with a GaAs-sample indicates the presence of large (non-uniformly distributed) SONs of ~10 pm/V in the area of UV-written waveguides

KW - Scanning optical microscopy; Second-harmonic generation

M3 - Journal article

SN - 0030-4018

VL - 221

SP - 6

JO - Optics Communications

JF - Optics Communications

IS - 4-6

ER -

High-resolution second-harmonic microscopy of poled silica waveguides

Abstract

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