TY - JOUR
T1 - High-resolution second-harmonic microscopy of poled silica waveguides
AU - Beermann, Jonas
AU - Bozhevolnyi, Sergey I.
AU - Pedersen, Kjeld
AU - Pedersen, Jacob Fage
PY - 2003
Y1 - 2003
N2 - A second-harmonic scanning optical microscopy (SHSOM) apparatus operating in reflection is used for high-resolution imaging of second-order optical non-linearities (SONs) in electric-field poled silica-based waveguides. SHSOM of domain walls in a periodically poled KTiOPO4 crystal is performed, and the spatial resolution at the pump wavelength of 790 nm is determined to be better than 0.7 m. SHSOM images of positively poled silica waveguides were obtained for different polarization combinations of the incident pump beam and the detected second-harmonic radiation. Calibration of the SHSOM with a GaAs-sample indicates the presence of large (non-uniformly distributed) SONs of ~10 pm/V in the area of UV-written waveguides
AB - A second-harmonic scanning optical microscopy (SHSOM) apparatus operating in reflection is used for high-resolution imaging of second-order optical non-linearities (SONs) in electric-field poled silica-based waveguides. SHSOM of domain walls in a periodically poled KTiOPO4 crystal is performed, and the spatial resolution at the pump wavelength of 790 nm is determined to be better than 0.7 m. SHSOM images of positively poled silica waveguides were obtained for different polarization combinations of the incident pump beam and the detected second-harmonic radiation. Calibration of the SHSOM with a GaAs-sample indicates the presence of large (non-uniformly distributed) SONs of ~10 pm/V in the area of UV-written waveguides
KW - Scanning optical microscopy; Second-harmonic generation
M3 - Journal article
SN - 0030-4018
VL - 221
SP - 6
JO - Optics Communications
JF - Optics Communications
IS - 4-6
ER -