High-resolution second-harmonic microscopy of poled silica waveguides

Jonas Beermann, Sergey I. Bozhevolnyi, Kjeld Pedersen, Jacob Fage Pedersen

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

A second-harmonic scanning optical microscopy (SHSOM) apparatus operating in reflection is used for high-resolution imaging of second-order optical non-linearities (SONs) in electric-field poled silica-based waveguides. SHSOM of domain walls in a periodically poled KTiOPO4 crystal is performed, and the spatial resolution at the pump wavelength of 790 nm is determined to be better than 0.7 m. SHSOM images of positively poled silica waveguides were obtained for different polarization combinations of the incident pump beam and the detected second-harmonic radiation. Calibration of the SHSOM with a GaAs-sample indicates the presence of large (non-uniformly distributed) SONs of ~10 pm/V in the area of UV-written waveguides
Original languageEnglish
JournalOptics Communications
Volume221
Issue number4-6
Pages (from-to)6
ISSN0030-4018
Publication statusPublished - 2003

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