High-resolution orientation imaging of nano-twins

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Abstract

The challenges of investigating the internal structure of materials containing features on the nano-scale can be met by combining the methods of electron backscatter diffraction, EBSD, and ion channeling imaging, ICI. While both EBSD and ICI are routinely applied for microstructure analysis, they have limited capabilities as single techniques due to either resolution limits (as for EBSD) or limited ability for quantitative crystallographic orientation analysis (with ICI). Complementing the information of both techniques, however, allows comprehensive microstructure analysis including also nano-sized features. The methodology of combining both techniques for that purpose is demonstrated on the example of electrodeposited nickel with numerous nano-twins in the microstructure.
Original languageEnglish
JournalProceedings of the Risø International Symposium on Materials Science
Volume33
Pages (from-to)175-180
ISSN0907-0079
Publication statusPublished - 2012
Event33rd Risø International Symposium on Materials Science: Nanometals - Status and Perspective - DTU Risø Campus, Roskilde, Denmark
Duration: 3 Sep 20127 Sep 2012

Conference

Conference33rd Risø International Symposium on Materials Science
LocationDTU Risø Campus
CountryDenmark
CityRoskilde
Period03/09/201207/09/2012

Bibliographical note

Proceedings of the 33rd Risø International Symposium on Materials Science : Nanometals - Status and Perspective

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