The challenges of investigating the internal structure of materials containing features on the nano-scale can be met by combining the methods of electron backscatter diffraction, EBSD, and ion channeling imaging, ICI. While both EBSD and ICI are routinely applied for microstructure analysis, they have limited capabilities as single techniques due to either resolution limits (as for EBSD) or limited ability for quantitative crystallographic orientation analysis (with ICI). Complementing the information of both techniques, however, allows comprehensive microstructure analysis including also nano-sized features. The methodology of combining both techniques for that purpose is demonstrated on the example of electrodeposited nickel with numerous nano-twins in the microstructure.
|Journal||Proceedings of the Risø International Symposium on Materials Science|
|Publication status||Published - 2012|
|Event||33rd Risø International Symposium on Materials Science: Nanometals - Status and Perspective - DTU Risø Campus, Roskilde, Denmark|
Duration: 3 Sep 2012 → 7 Sep 2012
|Conference||33rd Risø International Symposium on Materials Science|
|Location||DTU Risø Campus|
|Period||03/09/2012 → 07/09/2012|