High Resolution Orientation Distribution Function

Søren Schmidt, Nicolai Fog Gade-Nielsen, Martin Høstergaard, Bernd Dammann, Ivan G. Kazantsev

    Research output: Contribution to journalConference articleResearchpeer-review

    Abstract

    A new method for reconstructing a High Resolution Orientation Distribution Function (HRODF) from X-ray diffraction data is presented. It is shown that the method is capable of accommodating very localized features, e.g. sharp peaks from recrystallized grains on a background of a texture component from the deformed material. The underlying mathematical formalism supports all crystallographic space groups and reduces the problem to solving a (large) set of linear equations. An implementation on multi-core CPUs and Graphical Processing Units (GPUs) is discussed along with an example on simulated data.
    Original languageEnglish
    JournalMaterials Science Forum
    Volume702-703
    Pages (from-to)536-539
    ISSN0255-5476
    DOIs
    Publication statusPublished - 2012
    Event16th International Conference on Textures of Materials - Mumbai, India
    Duration: 12 Dec 201117 Dec 2011
    Conference number: 16

    Conference

    Conference16th International Conference on Textures of Materials
    Number16
    CountryIndia
    CityMumbai
    Period12/12/201117/12/2011

    Keywords

    • ODF
    • inverse problems
    • High resolution
    • x-ray

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