Abstract
A new method for reconstructing a High Resolution Orientation Distribution Function (HRODF) from X-ray diffraction data is presented. It is shown that the method is capable of accommodating very localized features, e.g. sharp peaks from recrystallized grains on a background of a texture component from the deformed material. The underlying mathematical formalism supports all crystallographic space groups and reduces the problem to solving a (large) set of linear equations. An implementation on multi-core CPUs and Graphical Processing Units (GPUs) is discussed along with an example on simulated data.
Original language | English |
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Journal | Materials Science Forum |
Volume | 702-703 |
Pages (from-to) | 536-539 |
ISSN | 0255-5476 |
DOIs | |
Publication status | Published - 2012 |
Event | 16th International Conference on Textures of Materials - Mumbai, India Duration: 12 Dec 2011 → 17 Dec 2011 Conference number: 16 |
Conference
Conference | 16th International Conference on Textures of Materials |
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Number | 16 |
Country/Territory | India |
City | Mumbai |
Period | 12/12/2011 → 17/12/2011 |
Keywords
- ODF
- inverse problems
- High resolution
- x-ray