High resolution ellipsometric study of n-alkane films adsorbed on Si (100)

U. G. Volkmann, M. Pine, H. Taub, H. Mo, Flemming Yssing Hansen

Research output: Contribution to journalConference articleResearchpeer-review

Original languageEnglish
JournalBulletin American Physical Society
Volume46
Issue number1
Pages (from-to)870
ISSN0003-0503
Publication statusPublished - 2001
Event2001 American Physical Society - Seattle, WA, United States
Duration: 12 Mar 200116 Mar 2001

Conference

Conference2001 American Physical Society
CountryUnited States
CitySeattle, WA
Period12/03/200116/03/2001

Cite this