High resolution ellipsometric study of n-alkane films adsorbed on Si (100)

U. G. Volkmann, M. Pine, H. Taub, H. Mo, Flemming Yssing Hansen

Research output: Contribution to journal › Conference article › Research › peer-review

Original language	English
Journal	Bulletin American Physical Society
Volume	46
Issue number	1
Pages (from-to)	870
ISSN	0003-0503
Publication status	Published - 2001
Event	2001 American Physical Society - Seattle, WA, United States Duration: 12 Mar 2001 → 16 Mar 2001

Cite this

@inproceedings{36bd9d2868c7446986ff4a26504d22c7,

title = "High resolution ellipsometric study of n-alkane films adsorbed on Si (100)",

author = "Volkmann, {U. G.} and M. Pine and H. Taub and H. Mo and Hansen, {Flemming Yssing}",

year = "2001",

language = "English",

volume = "46",

pages = "870",

journal = "American Physical Society. Bulletin",

issn = "0003-0503",

publisher = "American Institute of Physics",

number = "1",

note = "2001 American Physical Society ; Conference date: 12-03-2001 Through 16-03-2001",

}

TY - GEN

T1 - High resolution ellipsometric study of n-alkane films adsorbed on Si (100)

AU - Volkmann, U. G.

AU - Pine, M.

AU - Taub, H.

AU - Mo, H.

AU - Hansen, Flemming Yssing

PY - 2001

Y1 - 2001

M3 - Conference article

VL - 46

SP - 870

JO - American Physical Society. Bulletin

JF - American Physical Society. Bulletin

SN - 0003-0503

IS - 1

T2 - 2001 American Physical Society

Y2 - 12 March 2001 through 16 March 2001

ER -