Landgraf, B, Abalo, L, Barrière, NM, Bayerle, A, Borst, DD, Castiglione, L, Collon, MJ, Crama, L, Chatbi, A, Eenkhoorn, N, Girou, D, Günther, R, Hauser, E, Hoeven, RVD, Hollander, JD, Jenkins, Y, Lassise, A, Keek, L, Körnig, C, Obwaller, S, Okma, B, Ribeiro, PDS, Rizos, C, Thete, A, Vacanti, G, Verhoeckx, S, Vervest, M, Visser, R, Voruz, L, Bavdaz, M, Wille, E, Ferreira, I, Bosman, M, Haneveld, J, Koelewijn, A, Lankwarden, J-J, Riekerink, MO, Schurink, B, Start, R, Wijnperle, M, Baren, CV, Cibik, L, Krumrey, M, Skroblin, D, Burwitz, V
, Christensen, FE, Ferreira, DDM, Massahi, S, Sanz, DP, Svendsen, S, Dunnell, E, Lupton, P, Mundon, W, Rees, A & Watley, D 2023,
High-resolution and light-weight silicon pore x-ray optics. in SL O'Dell, JA Gaskin, G Pareschi & D Spiga (eds),
Proceedings of SPIE: Optics for EUV, X-Ray, and Gamma-Ray Astronomy XI. vol. 12679, 1267903, SPIE - The International Society for Optical Engineering, Proceedings of SPIE - The International Society for Optical Engineering, vol. 12679, SPIE Optical Engineering + Applications 2023, San Diego, California, United States,
20/08/2023.
https://doi.org/10.1117/12.2678106