Abstract
The application of an intense THz field results a nonlinear transmission in high resistivity silicon. Upon increasing field strength, the transmission falls from 70% to 62% due to carrier generation through THz-induced impact ionization and subsequent absorption of the THz field by free electrons.
Original language | English |
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Title of host publication | Proceedings of 2015 40th International Conference on Infrared, Millimeter, and Terahertz waves |
Number of pages | 1 |
Publisher | IEEE |
Publication date | 2015 |
ISBN (Print) | 9781479982721 |
DOIs | |
Publication status | Published - 2015 |
Event | 40th International Conference on Infrared, Millimeter, and Terahertz Waves - Chinese University of Hong Kong, Hong Kong Duration: 23 Aug 2015 → 28 Aug 2015 |
Conference
Conference | 40th International Conference on Infrared, Millimeter, and Terahertz Waves |
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Location | Chinese University of Hong Kong |
Country/Territory | Hong Kong |
Period | 23/08/2015 → 28/08/2015 |
Keywords
- Communication, Networking and Broadcast Technologies
- Engineered Materials, Dielectrics and Plasmas
- Fields, Waves and Electromagnetics
- Photonics and Electrooptics
- Absorption
- Antenna arrays
- Arrays
- Conductivity
- Impact ionization
- Resonant frequency
- Silicon