Hardware-in-the-loop (HIL) Test of Demand as Frequency Controlled Reserve (DFR)

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Abstract

This paper presents the hardware-in-the-loop (HIL) test of the demand as frequency controlled reserve (DFR). The HIL test refers to a test in which parts of a pure simulation have been replaced by actual physical components. It is used to understand the behavior of a new device or controller. The DFR has been tested by offline simulations to illustrate the efficacy of this technology. The DFR control logics have been implemented in the SmartBox. The HIL was conducted by having the SmartBox connected to the real time simulations and the performance of the SmartBox was tested with difference frequency events in the simulated power systems. The HIL test results show that the implemented DFR in the SmartBox can efficiently arrest the system frequency.
Original languageEnglish
Title of host publicationProceedings of 10th International Conference on Advances in Power System Control, Operation and Management,
Number of pages6
PublisherInstitution of Engineering and Technology
Publication date2016
Publication statusPublished - 2016
Event10th IET International Conference on Advances in Power System Control, Operation and Management - Hong Kong, Hong Kong
Duration: 8 Nov 201512 Nov 2015
Conference number: 10

Conference

Conference10th IET International Conference on Advances in Power System Control, Operation and Management
Number10
CountryHong Kong
CityHong Kong
Period08/11/201512/11/2015

Keywords

  • Demand as frequency controlled reserve
  • Hardware-in-the-loop
  • Real Time Digital Simulator

Cite this

Wu, Q., Zimmermann, K., Østergaard, J., & Nielsen, A. H. (2016). Hardware-in-the-loop (HIL) Test of Demand as Frequency Controlled Reserve (DFR). In Proceedings of 10th International Conference on Advances in Power System Control, Operation and Management, Institution of Engineering and Technology.