| Original language | English |
|---|---|
| Title of host publication | Proceedings of the SPIE meeting |
| Volume | 4012 |
| Publication date | 2000 |
| Pages | 626-638 |
| Publication status | Published - 2000 |
| Event | SPIE meeting - Munich, Germany Duration: 27 Mar 2000 → 29 Mar 2000 |
Conference
| Conference | SPIE meeting |
|---|---|
| Country | Germany |
| City | Munich |
| Period | 27/03/2000 → 29/03/2000 |
Cite this
}
Hard X-ray characterisation of a HEFT single reflection prototype. / Christensen, Finn Erland; Craig, W.W.; Hailey, J.; Jimenez-Garate, M.A.; Windt, D.L.; Harrison, F.A.; Mao, P.H.; Ziegler, E.; Honkimaki, V.; del Rio, M.S.; Freund, A.K.; Ohler, M.
Proceedings of the SPIE meeting. Vol. 4012 2000. p. 626-638.Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review
TY - GEN
T1 - Hard X-ray characterisation of a HEFT single reflection prototype
AU - Christensen, Finn Erland
AU - Craig, W.W.
AU - Hailey, J.
AU - Jimenez-Garate, M.A.
AU - Windt, D.L.
AU - Harrison, F.A.
AU - Mao, P.H.
AU - Ziegler, E.
AU - Honkimaki, V.
AU - del Rio, M.S.
AU - Freund, A.K.
AU - Ohler, M.
PY - 2000
Y1 - 2000
M3 - Article in proceedings
VL - 4012
SP - 626
EP - 638
BT - Proceedings of the SPIE meeting
ER -