Hard X-ray characterisation of a HEFT single reflection prototype

Finn Erland Christensen, W.W. Craig, J. Hailey, M.A. Jimenez-Garate, D.L. Windt, F.A. Harrison, P.H. Mao, E. Ziegler, V. Honkimaki, M.S. del Rio, A.K. Freund, M. Ohler

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of the SPIE meeting
Volume4012
Publication date2000
Pages626-638
Publication statusPublished - 2000
EventSPIE meeting - Munich, Germany
Duration: 27 Mar 200029 Mar 2000

Conference

ConferenceSPIE meeting
CountryGermany
CityMunich
Period27/03/200029/03/2000

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