@inproceedings{65b8047943be4d33acb2ef44512970c5,
title = "Handheld ESPI-speckle interferometer",
abstract = "A {"}handheld{"} speckle interferometer for measuring out-of-plane displacements on reflective as well as diffusely scattering object surfaces is presented. The interferometer is a nearly path length compensated set-up which uses diffuse illumination of the object in combination with a speckled reference. The reference wave is established by reflecting a part of the diffuse object illumination from a glass plate located just in front of the object. The glass plate is mounted on a piezoelectric translator in order to control the phase of the reference wave when using phase stepping algorithms. The coherent light source is a laser diode. A web camera with a Universal Serial Bus (USB) interface is employed as the image-capturing device. Likewise, is the piezoelectric translator controlled through the USB interface. The necessary size of the optical set-up depends on the size of the object. The interferometer presented here is a compact version of the set-up, Which is capable of measuring displacements of small objects, having either a specularly reflecting-or a diffusely scattering surface. The small optical set-up together with the use of the popular USB-communication for acquiring the images and controlling the phase of the reference wave constitutes a compact {"}handheld{"} instrument and eliminates the need for installing extra hardware, such as frame grabber and Digital to Analog converter, in the host computer. ",
keywords = "6-I optik, speckle interferometry, ESPI, specular surface displacement, USB, universal serial bus",
author = "{Skov Hansen}, Ren{\'e}",
year = "2003",
doi = "10.1117/12.516645",
language = "English",
isbn = "0-8194-4728-5",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "International Society for Optical Engineering",
pages = "246--249",
editor = "K. Gastinger and O.J. L{\o}kberg and S. Winther",
booktitle = "Proceedings of Speckle Metrology 2003",
note = "Speckle metrology 2003 ; Conference date: 18-06-2003 Through 20-06-2003",
}