Handheld ESPI-speckle interferometer

René Skov Hansen

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Abstract

    A "handheld" speckle interferometer for measuring out-of-plane displacements on reflective as well as diffusely scattering object surfaces is presented. The interferometer is a nearly path length compensated set-up which uses diffuse illumination of the object in combination with a speckled reference. The reference wave is established by reflecting a part of the diffuse object illumination from a glass plate located just in front of the object. The glass plate is mounted on a piezoelectric translator in order to control the phase of the reference wave when using phase stepping algorithms. The coherent light source is a laser diode. A web camera with a Universal Serial Bus (USB) interface is employed as the image-capturing device. Likewise, is the piezoelectric translator controlled through the USB interface. The necessary size of the optical set-up depends on the size of the object. The interferometer presented here is a compact version of the set-up, Which is capable of measuring displacements of small objects, having either a specularly reflecting-or a diffusely scattering surface. The small optical set-up together with the use of the popular USB-communication for acquiring the images and controlling the phase of the reference wave constitutes a compact "handheld" instrument and eliminates the need for installing extra hardware, such as frame grabber and Digital to Analog converter, in the host computer.
    Original languageEnglish
    Title of host publicationProceedings of Speckle Metrology 2003
    EditorsK. Gastinger, O.J. Løkberg, S. Winther
    Place of PublicationBellingham, WA
    PublisherInternational Society for Optical Engineering
    Publication date2003
    Pages246-249
    ISBN (Print)0-8194-4728-5
    DOIs
    Publication statusPublished - 2003
    EventSpeckle metrology 2003 - Trondheim, Norway
    Duration: 18 Jun 200320 Jun 2003

    Conference

    ConferenceSpeckle metrology 2003
    Country/TerritoryNorway
    CityTrondheim
    Period18/06/200320/06/2003
    SeriesProceedings of SPIE - The International Society for Optical Engineering
    ISSN0277-786X

    Keywords

    • speckle interferometry
    • ESPI
    • specular surface displacement
    • USB
    • universal serial bus

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