Abstract
procedure for grey-scale conversion of energy dispersive spectroscopy X-ray maps has been developed, which is particularly useful for the plotting of line composition profiles across modified layered engineering surfaces. The method involves (a) the collection of grey-scale elemental maps, (b) the calculation of mean grey-scale levels along strips parallel to the layered microstructure and (c) the conversion of grey-scale line profiles into composition line profiles. As an example of the grey-scale conversion method and its advantages for multielement and multiphase layered microstructures, the procedure has been applied to a layered microstructure that results from a plasma-sprayed metallic MCrAlY coating onto a nickel-superalloy turbine blade. As a further demonstration of the accuracy and amount of compositional data that can be obtained with this procedure, measured compositional profiles have been obtained for several long-term isothermal heat treatments in which significant interdiffusion has taken place. The resulting composition profiles have greatly improved counting statistics compared to traditional point-by-point scans for the same scanning electron microscope time and may be considered as a rapid alternative to energy dispersive spectroscopy spectrum imaging. The composition profiles obtained may be conveniently compared with results of multicomponent thermodynamic modelling of interdiffusion.
Original language | English |
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Journal | Journal of Microscopy |
Volume | 225 |
Issue number | 1 |
Pages (from-to) | 31-40 |
ISSN | 0022-2720 |
DOIs | |
Publication status | Published - 2007 |
Keywords
- grey-scale conversion
- spectrum imaging
- compositional imaging
- layered microstructures
- EDS
- X-ray mapping
- line profiles