Grazing incidence X-ray ptychography for in situ studies of thin sub-monolayer films of nanoparticles

Azat Slyamov*, Peter Stanley Jørgensen, Christian Rein, M. Odstrčil, Jens Wenzel Andreasen

*Corresponding author for this work

Research output: Contribution to conferenceConference abstract for conferenceResearchpeer-review

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Abstract

Grazing incidence X-ray ptychography is a promising technique for investigation of thin sub-monolayer films of nanoparticles. Preliminary results on a reconstruction of a test sample are presented. A potential impact for characterization of surface energy, particle size and growth due to Ostwald ripening is expected.
Original languageEnglish
Publication date2019
Number of pages2
Publication statusPublished - 2019
Event2019 International Conference on Tomography of Materials & Structures - Pullman Cairns International, Cairns, Australia
Duration: 22 Jul 201926 Jul 2019
http://ictms2019.org/

Conference

Conference2019 International Conference on Tomography of Materials & Structures
LocationPullman Cairns International
CountryAustralia
CityCairns
Period22/07/201926/07/2019
Internet address

Cite this

Slyamov, A., Jørgensen, P. S., Rein, C., Odstrčil, M., & Andreasen, J. W. (2019). Grazing incidence X-ray ptychography for in situ studies of thin sub-monolayer films of nanoparticles. Abstract from 2019 International Conference on Tomography of Materials & Structures, Cairns, Australia.