Grazing incidence X-ray ptychography is a promising technique for investigation of thin sub-monolayer films of nanoparticles. Preliminary results on a reconstruction of a test sample are presented. A potential impact for characterization of surface energy, particle size and growth due to Ostwald ripening is expected.
|Number of pages||2|
|Publication status||Published - 2019|
|Event||2019 International Conference on Tomography of Materials & Structures - Pullman Cairns International, Cairns, Australia|
Duration: 22 Jul 2019 → 26 Jul 2019
|Conference||2019 International Conference on Tomography of Materials & Structures|
|Location||Pullman Cairns International|
|Period||22/07/2019 → 26/07/2019|
Slyamov, A., Jørgensen, P. S., Rein, C., Odstrčil, M., & Andreasen, J. W. (2019). Grazing incidence X-ray ptychography for in situ studies of thin sub-monolayer films of nanoparticles. Abstract from 2019 International Conference on Tomography of Materials & Structures, Cairns, Australia.