Grazing incidence X-ray ptychography for in situ studies of thin sub-monolayer films of nanoparticles

Azat Slyamov*, Peter Stanley Jørgensen, Christian Rein, M. Odstrčil, Jens Wenzel Andreasen

*Corresponding author for this work

Research output: Contribution to conferenceConference abstract for conferenceResearchpeer-review

116 Downloads (Orbit)

Abstract

Grazing incidence X-ray ptychography is a promising technique for investigation of thin sub-monolayer films of nanoparticles. Preliminary results on a reconstruction of a test sample are presented. A potential impact for characterization of surface energy, particle size and growth due to Ostwald ripening is expected.
Original languageEnglish
Publication date2019
Number of pages2
Publication statusPublished - 2019
Event2019 International Conference on Tomography of Materials & Structures - Pullman Cairns International, Cairns, Australia
Duration: 22 Jul 201926 Jul 2019
http://ictms2019.org/

Conference

Conference2019 International Conference on Tomography of Materials & Structures
LocationPullman Cairns International
Country/TerritoryAustralia
CityCairns
Period22/07/201926/07/2019
Internet address

Fingerprint

Dive into the research topics of 'Grazing incidence X-ray ptychography for in situ studies of thin sub-monolayer films of nanoparticles'. Together they form a unique fingerprint.

Cite this