Three-Dimensional X-ray Diraction (3DXRD) Microscopy is a generic term covering a variety of dierent techniques for characterising the mi- crostructure within the bulk of polycrystalline materials. One strategy | namely grain centre mapping | enables fast measurements of the av- erage characteristics of each grain (such as their centre-of-mass positions, volumes, phases, orientations and/or elastic strain tensor components), while the exact locations of the grain boundaries are unknown. In the present chapter a detailed description of the setup and software for both grain centre mapping and the closely related boxscan method is given. Both validation experiments and applications for in situ studies of microstructural changes during plastic deformation and crack growth are given. Finally an outlook with special emphasis on coupling the measured results with modelling is given.
|Title of host publication||Strain and Dislocation Gradients from Diffraction : Spatially-Resolved Local Structure and Defects.|
|Editors||Rozaliya Barabash, Gene Ice|
|Publication status||Published - 2014|