Grain centre mapping - 3DXRD measurements of average grain characteristics.

Jette Oddershede, Søren Schmidt, Allan Lyckegaard, Erik Mejdal Lauridsen, Jonathan Paul Wright, Grethe Winther

Research output: Chapter in Book/Report/Conference proceedingBook chapterResearchpeer-review


Three-Dimensional X-ray Diraction (3DXRD) Microscopy is a generic term covering a variety of dierent techniques for characterising the mi- crostructure within the bulk of polycrystalline materials. One strategy | namely grain centre mapping | enables fast measurements of the av- erage characteristics of each grain (such as their centre-of-mass positions, volumes, phases, orientations and/or elastic strain tensor components), while the exact locations of the grain boundaries are unknown. In the present chapter a detailed description of the setup and software for both grain centre mapping and the closely related boxscan method is given. Both validation experiments and applications for in situ studies of microstructural changes during plastic deformation and crack growth are given. Finally an outlook with special emphasis on coupling the measured results with modelling is given.
Original languageEnglish
Title of host publicationStrain and Dislocation Gradients from Diffraction : Spatially-Resolved Local Structure and Defects.
EditorsRozaliya Barabash, Gene Ice
PublisherWorld Scientific
Publication date2014
ISBN (Print)978-1-908979-62-9
Publication statusPublished - 2014


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