Geometrical metrology on silicone rubber by computed tomography

Pavel Müller, Ramona Alexandra Pacurar, Leonardo De Chiffre, Angela Cantatore, P. Berce

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    Abstract

    Computed tomography (CT) represents a suitable measuring technique for investigation of deformable materials, since no forces are developed on the part during scanning. As for any other measuring instruments, the traceability of the CT scanners needs to be assured. An investigation on geometrical measurements on silicone rubber using CT was carried out. Measurements performed on a CT scanner were compared to measurements on a coordinate measuring machine (CMM), being used as reference.
    Original languageEnglish
    Title of host publicationProceedings of 11th International Conference of the European Society for Precision Engineering & Nano Technology
    Publishereuspen
    Publication date2011
    ISBN (Print)9780955308291
    Publication statusPublished - 2011
    Event11th International Conference of the European Society for Precision Engineering and Nanotechnology - Como, Italy
    Duration: 23 May 201127 May 2011
    Conference number: 11
    http://www.como2011.euspen.eu/

    Conference

    Conference11th International Conference of the European Society for Precision Engineering and Nanotechnology
    Number11
    Country/TerritoryItaly
    CityComo
    Period23/05/201127/05/2011
    Internet address

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