Geometrical metrology on silicone rubber by computed tomography

Pavel Müller, Ramona Alexandra Pacurar, Leonardo De Chiffre, Angela Cantatore, P. Berce

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Abstract

Computed tomography (CT) represents a suitable measuring technique for investigation of deformable materials, since no forces are developed on the part during scanning. As for any other measuring instruments, the traceability of the CT scanners needs to be assured. An investigation on geometrical measurements on silicone rubber using CT was carried out. Measurements performed on a CT scanner were compared to measurements on a coordinate measuring machine (CMM), being used as reference.
Original languageEnglish
Title of host publicationProceedings of 11th International Conference of the European Society for Precision Engineering & Nano Technology
Publishereuspen
Publication date2011
ISBN (Print)9780955308291
Publication statusPublished - 2011
Event11th International Conference of the European Society for Precision Engineering and Nanotechnology - Como, Italy
Duration: 23 May 201127 May 2011
Conference number: 11
http://www.como2011.euspen.eu/

Conference

Conference11th International Conference of the European Society for Precision Engineering and Nanotechnology
Number11
CountryItaly
CityComo
Period23/05/201127/05/2011
Internet address

Cite this

Müller, P., Pacurar, R. A., De Chiffre, L., Cantatore, A., & Berce, P. (2011). Geometrical metrology on silicone rubber by computed tomography. In Proceedings of 11th International Conference of the European Society for Precision Engineering & Nano Technology euspen.