Gaussian Process Regression for WDM System Performance Prediction

Jesper Wass, Jakob Thrane, Molly Piels, Rasmus Thomas Jones, Darko Zibar

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review


Gaussian process regression is numerically and experimentally investigated to predict the bit error rate of a 24 x 28 CiBd QPSK WDM system. The proposed method produces accurate predictions from multi-dimensional and sparse measurement data.
Original languageEnglish
Title of host publicationOptical Fiber Communication Conference 2017
Number of pages3
PublisherOptical Society of America (OSA)
Publication date2017
Article numberTu3D.7
ISBN (Print)978-1-943580-23-1
Publication statusPublished - 2017
EventOptical Fiber Communication Conference 2017 - Los Angeles, United States
Duration: 19 Mar 201723 Mar 2017


ConferenceOptical Fiber Communication Conference 2017
Country/TerritoryUnited States
CityLos Angeles

Bibliographical note

From the session: Linear and Nonlinear Multicarrier Systems (Tu3D)


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