Functional Testing of Wireless Sensor Node Designs

Kashif M. Virk; Jan Madsen

doi:10.1109/IIT.2007.4430412

Functional Testing of Wireless Sensor Node Designs

Kashif M. Virk, Jan Madsen

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

Wireless sensor networks are networked embedded computer systems with stringent power, performance, cost and form-factor requirements along with numerous other constraints related to their pervasiveness and ubiquitousness. Therefore, only a systematic design methdology coupled with an efficient test approach can enable their conformance to design and deployment specifications. We discuss off-line, hierarchical, functional testing of complete wireless sensor nodes containing configurable logic through a combination of FPGA-based board test and Software-Based Self-Test (SBST) techniques. The proposed functional test methodology has been applied to a COTS-based sensor node development platform and can be applied, in general, for testing all types of wireless sensor node designs.

Original language	English
Title of host publication	4th International Conference on Innovations in Information Technology : Innovations'07
Publisher	IEEE
Publication date	2007
ISBN (Print)	9781424418404
DOIs	https://doi.org/10.1109/IIT.2007.4430412
Publication status	Published - 2007
Event	4th International Conference on Innovations in Information Technology - Dubai, United Arab Emirates Duration: 1 Jan 2007 → …

Conference

Conference	4th International Conference on Innovations in Information Technology
City	Dubai, United Arab Emirates
Period	01/01/2007 → …

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10.1109/IIT.2007.4430412

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title = "Functional Testing of Wireless Sensor Node Designs",

abstract = "Wireless sensor networks are networked embedded computer systems with stringent power, performance, cost and form-factor requirements along with numerous other constraints related to their pervasiveness and ubiquitousness. Therefore, only a systematic design methdology coupled with an efficient test approach can enable their conformance to design and deployment specifications. We discuss off-line, hierarchical, functional testing of complete wireless sensor nodes containing configurable logic through a combination of FPGA-based board test and Software-Based Self-Test (SBST) techniques. The proposed functional test methodology has been applied to a COTS-based sensor node development platform and can be applied, in general, for testing all types of wireless sensor node designs.",

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AU - Madsen, Jan

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N2 - Wireless sensor networks are networked embedded computer systems with stringent power, performance, cost and form-factor requirements along with numerous other constraints related to their pervasiveness and ubiquitousness. Therefore, only a systematic design methdology coupled with an efficient test approach can enable their conformance to design and deployment specifications. We discuss off-line, hierarchical, functional testing of complete wireless sensor nodes containing configurable logic through a combination of FPGA-based board test and Software-Based Self-Test (SBST) techniques. The proposed functional test methodology has been applied to a COTS-based sensor node development platform and can be applied, in general, for testing all types of wireless sensor node designs.

AB - Wireless sensor networks are networked embedded computer systems with stringent power, performance, cost and form-factor requirements along with numerous other constraints related to their pervasiveness and ubiquitousness. Therefore, only a systematic design methdology coupled with an efficient test approach can enable their conformance to design and deployment specifications. We discuss off-line, hierarchical, functional testing of complete wireless sensor nodes containing configurable logic through a combination of FPGA-based board test and Software-Based Self-Test (SBST) techniques. The proposed functional test methodology has been applied to a COTS-based sensor node development platform and can be applied, in general, for testing all types of wireless sensor node designs.

U2 - 10.1109/IIT.2007.4430412

DO - 10.1109/IIT.2007.4430412

M3 - Article in proceedings

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BT - 4th International Conference on Innovations in Information Technology

PB - IEEE

T2 - 4th International Conference on Innovations in Information Technology

Y2 - 1 January 2007

ER -

Functional Testing of Wireless Sensor Node Designs

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