Wireless sensor networks are networked embedded computer systems with stringent power, performance, cost and form-factor requirements along with numerous other constraints related to their pervasiveness and ubiquitousness. Therefore, only a systematic design methdology coupled with an efficient test approach can enable their conformance to design and deployment specifications. We discuss off-line, hierarchical, functional testing of complete wireless sensor nodes containing configurable logic through a combination of FPGA-based board test and Software-Based Self-Test (SBST) techniques. The proposed functional test methodology has been applied to a COTS-based sensor node development platform and can be applied, in general, for testing all types of wireless sensor node designs.
|Title of host publication||4th International Conference on Innovations in Information Technology : Innovations'07|
|Publication status||Published - 2007|
|Event||4th International Conference on Innovations in Information Technology - Dubai, United Arab Emirates|
Duration: 1 Jan 2007 → …
|Conference||4th International Conference on Innovations in Information Technology|
|City||Dubai, United Arab Emirates|
|Period||01/01/2007 → …|