Full‐field neutron microscopy based on refractive optics

Hanna Leemreize, Erik B. Knudsen, Jonas O. Birk, Markus Strobl, Carsten Detlefs, Henning F. Poulsen*

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Abstract

Placing a compound refractive lens (CRL) as an objective in a neutron beam generates new possibilities for 2D and 3D nondestructive mapping of the structure, strain and magnetic domains within extended objects. A condenser setup is introduced that allows correction for the lateral chromatic aberration. More generally, for full‐field microscopy the loss in performance caused by the chromatic aberration can be more than offset by introducing arrays of CRLs and exploiting the fact that the field of view can be much larger than the physical aperture of the CRL. Comments are made on the manufacture of such devices. The potential use is illustrated by comparisons between state‐of‐the‐art instrumentation and suggested approaches for bright‐field microscopy, small‐angle neutron scattering microscopy, grain mapping and mapping of stresses. Options are discussed for depth‐resolved imaging inspired by confocal light microscopy. Finally, experimental demonstrations are given of some of the basic properties of neutron full‐field imaging for a single CRL.
Original languageEnglish
JournalJournal of Applied Crystallography
Volume52
Issue number6
Number of pages13
ISSN0021-8898
DOIs
Publication statusPublished - 2019

Keywords

  • Neutron imaging
  • Neutron diffraction
  • Small-angle neutron scattering
  • SANS
  • Stress mapping
  • Grain mapping
  • Neutron optics
  • Compound refractive lenses

Cite this

Leemreize, Hanna ; Knudsen, Erik B. ; Birk, Jonas O. ; Strobl, Markus ; Detlefs, Carsten ; Poulsen, Henning F. / Full‐field neutron microscopy based on refractive optics. In: Journal of Applied Crystallography. 2019 ; Vol. 52, No. 6.
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abstract = "Placing a compound refractive lens (CRL) as an objective in a neutron beam generates new possibilities for 2D and 3D nondestructive mapping of the structure, strain and magnetic domains within extended objects. A condenser setup is introduced that allows correction for the lateral chromatic aberration. More generally, for full‐field microscopy the loss in performance caused by the chromatic aberration can be more than offset by introducing arrays of CRLs and exploiting the fact that the field of view can be much larger than the physical aperture of the CRL. Comments are made on the manufacture of such devices. The potential use is illustrated by comparisons between state‐of‐the‐art instrumentation and suggested approaches for bright‐field microscopy, small‐angle neutron scattering microscopy, grain mapping and mapping of stresses. Options are discussed for depth‐resolved imaging inspired by confocal light microscopy. Finally, experimental demonstrations are given of some of the basic properties of neutron full‐field imaging for a single CRL.",
keywords = "Neutron imaging, Neutron diffraction, Small-angle neutron scattering, SANS, Stress mapping, Grain mapping, Neutron optics, Compound refractive lenses",
author = "Hanna Leemreize and Knudsen, {Erik B.} and Birk, {Jonas O.} and Markus Strobl and Carsten Detlefs and Poulsen, {Henning F.}",
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journal = "Journal of Applied Crystallography",
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Full‐field neutron microscopy based on refractive optics. / Leemreize, Hanna; Knudsen, Erik B.; Birk, Jonas O.; Strobl, Markus; Detlefs, Carsten; Poulsen, Henning F.

In: Journal of Applied Crystallography, Vol. 52, No. 6, 2019.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - Full‐field neutron microscopy based on refractive optics

AU - Leemreize, Hanna

AU - Knudsen, Erik B.

AU - Birk, Jonas O.

AU - Strobl, Markus

AU - Detlefs, Carsten

AU - Poulsen, Henning F.

PY - 2019

Y1 - 2019

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AB - Placing a compound refractive lens (CRL) as an objective in a neutron beam generates new possibilities for 2D and 3D nondestructive mapping of the structure, strain and magnetic domains within extended objects. A condenser setup is introduced that allows correction for the lateral chromatic aberration. More generally, for full‐field microscopy the loss in performance caused by the chromatic aberration can be more than offset by introducing arrays of CRLs and exploiting the fact that the field of view can be much larger than the physical aperture of the CRL. Comments are made on the manufacture of such devices. The potential use is illustrated by comparisons between state‐of‐the‐art instrumentation and suggested approaches for bright‐field microscopy, small‐angle neutron scattering microscopy, grain mapping and mapping of stresses. Options are discussed for depth‐resolved imaging inspired by confocal light microscopy. Finally, experimental demonstrations are given of some of the basic properties of neutron full‐field imaging for a single CRL.

KW - Neutron imaging

KW - Neutron diffraction

KW - Small-angle neutron scattering

KW - SANS

KW - Stress mapping

KW - Grain mapping

KW - Neutron optics

KW - Compound refractive lenses

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JO - Journal of Applied Crystallography

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