From Image Processing to Classification: 1. Modelling Disturbances of Isoelectric Focusing Patterns

Karsten Jensen; I. Søndergaard; I. M. Skovgaard; Hans Bruun Nielsen

doi:10.1002/elps.11501601155

From Image Processing to Classification: 1. Modelling Disturbances of Isoelectric Focusing Patterns

Karsten Jensen, I. Søndergaard, I. M. Skovgaard, Hans Bruun Nielsen

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

In order to optimize the conditions for evaluation of isoelectric focusing (IEF) patterns by digital image processing, the sources of error in determination of the pi values were analyzed together with the influence of a varying background. The effects of band distortions, in the spectra of the individual lanes, were examined. In order to minimize the effect of these distortions, optimal conditions for handling IEF patterns by digital image processing were elucidated. The systematic part of the global deformation on the gels was investigated and an algorithm was developed by which it was possible to correct for a part of the individual distortions. The effects of various corrections for lane distortions were illustrated by classification, using different types of discriminant analysis. Finally the background disturbances were examined, and described by a mathematical model.

Original language	English
Journal	Electrophoresis
Volume	16
Issue number	6
Pages (from-to)	921-926
ISSN	0173-0835
DOIs	https://doi.org/10.1002/elps.11501601155
Publication status	Published - 1995

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title = "From Image Processing to Classification: 1. Modelling Disturbances of Isoelectric Focusing Patterns",

abstract = "In order to optimize the conditions for evaluation of isoelectric focusing (IEF) patterns by digital image processing, the sources of error in determination of the pi values were analyzed together with the influence of a varying background. The effects of band distortions, in the spectra of the individual lanes, were examined. In order to minimize the effect of these distortions, optimal conditions for handling IEF patterns by digital image processing were elucidated. The systematic part of the global deformation on the gels was investigated and an algorithm was developed by which it was possible to correct for a part of the individual distortions. The effects of various corrections for lane distortions were illustrated by classification, using different types of discriminant analysis. Finally the background disturbances were examined, and described by a mathematical model.",

author = "Karsten Jensen and I. S{\o}ndergaard and Skovgaard, {I. M.} and Nielsen, {Hans Bruun}",

year = "1995",

doi = "10.1002/elps.11501601155",

language = "English",

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journal = "Electrophoresis",

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T1 - From Image Processing to Classification: 1. Modelling Disturbances of Isoelectric Focusing Patterns

AU - Jensen, Karsten

AU - Søndergaard, I.

AU - Skovgaard, I. M.

AU - Nielsen, Hans Bruun

PY - 1995

Y1 - 1995

N2 - In order to optimize the conditions for evaluation of isoelectric focusing (IEF) patterns by digital image processing, the sources of error in determination of the pi values were analyzed together with the influence of a varying background. The effects of band distortions, in the spectra of the individual lanes, were examined. In order to minimize the effect of these distortions, optimal conditions for handling IEF patterns by digital image processing were elucidated. The systematic part of the global deformation on the gels was investigated and an algorithm was developed by which it was possible to correct for a part of the individual distortions. The effects of various corrections for lane distortions were illustrated by classification, using different types of discriminant analysis. Finally the background disturbances were examined, and described by a mathematical model.

AB - In order to optimize the conditions for evaluation of isoelectric focusing (IEF) patterns by digital image processing, the sources of error in determination of the pi values were analyzed together with the influence of a varying background. The effects of band distortions, in the spectra of the individual lanes, were examined. In order to minimize the effect of these distortions, optimal conditions for handling IEF patterns by digital image processing were elucidated. The systematic part of the global deformation on the gels was investigated and an algorithm was developed by which it was possible to correct for a part of the individual distortions. The effects of various corrections for lane distortions were illustrated by classification, using different types of discriminant analysis. Finally the background disturbances were examined, and described by a mathematical model.

U2 - 10.1002/elps.11501601155

DO - 10.1002/elps.11501601155

M3 - Journal article

SN - 0173-0835

VL - 16

SP - 921

EP - 926

JO - Electrophoresis

JF - Electrophoresis

IS - 6

ER -

From Image Processing to Classification: 1. Modelling Disturbances of Isoelectric Focusing Patterns

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