Formation of a random recrystallization texture in heavily cold rolled and annealed Al-1%Si alloy

Y.L. Chen, T.L. Huang, X. Gong, G.L. Wu, Q. Liu, Xiaoxu Huang

    Research output: Contribution to journalConference articleResearchpeer-review

    Abstract

    An Al-1%Si alloy cold rolled to a von Mises stain of 4.5 was isothermally annealed at 210°C. A random recrystallization texture was obtained, which was attributed to the effects of particles of different sizes on the nucleation and growth of grains during recrystallization. © (2013) Trans Tech Publications, Switzerland.
    Original languageEnglish
    JournalMaterials Science Forum
    Volume753
    Pages (from-to)243-246
    ISSN0255-5476
    DOIs
    Publication statusPublished - 2013
    Event5th International Conference on Recrystallization and Grain Growth - Sydney, Australia
    Duration: 5 May 201310 May 2013

    Conference

    Conference5th International Conference on Recrystallization and Grain Growth
    Country/TerritoryAustralia
    CitySydney
    Period05/05/201310/05/2013

    Keywords

    • Aluminum
    • Cerium alloys
    • Cold rolling
    • Crystallization
    • Grain growth
    • Metal cladding
    • Recrystallization (metallurgy)
    • Silicon
    • Textures
    • Silicon alloys

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