Focusing Optics for High-Energy X-ray Diffraction

U. Leinert, C. Schulze, V. Honkimäki, Th. Tshentscher, S. Garbe, O. Hignette, Andy Horsewell, M. Lingham, Henning Friis Poulsen, E. Ziegler

    Research output: Contribution to journalConference articleResearchpeer-review

    Abstract

    Novel focusing optical devices have been developed for synchrotron radiation in the energy range 40-100 keV. Firstly, a narrow-band-pass focusing energy-tuneable fixed-exit monochromator was constructed by combining meridionally bent Laue and Bragg crystals. Dispersion compensation was applied to retain the high momentum resolution despite the beam divergence caused by the focusing. Next, microfocusing was achieved by a bent multilayer arranged behind the crystal monochromator and alternatively by a bent Laue crystal. A 1.2 mu m-high line focus was obtained at 90 keV. The properties of the different set-ups are described and potential applications are discussed. First experiments were performed, investigating with high spatial resolution the residual strain gradients in layered polycrystalline materials. The results underline that focused high-energy synchrotron radiation can provide unique information on the mesoscopic scale to the materials scientist, complementary to existing techniques based on conventional X-ray sources, neutron scattering or electron microscopy.
    Original languageEnglish
    JournalJournal of Synchrotron Radiation
    Volume5
    Issue number3
    Pages (from-to)226-231
    ISSN0909-0495
    DOIs
    Publication statusPublished - 1998
    Event6th International Conference on Synchrotron Radiation Instrumentation (SRI'97) - Himeji, Japan
    Duration: 4 Aug 19978 Aug 1997
    Conference number: 6

    Conference

    Conference6th International Conference on Synchrotron Radiation Instrumentation (SRI'97)
    Number6
    CountryJapan
    CityHimeji
    Period04/08/199708/08/1997

    Keywords

    • focusing optics
    • high-energy synchrotron diffraction
    • strain gradients

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