Finding small displacements of recorded speckle patterns: revisited

Steen Grüner Hanson; Michael Linde Jakobsen; Maumita Chakrabarti; Harold Yura

doi:10.1117/12.2195631

Finding small displacements of recorded speckle patterns: revisited

Steen Grüner Hanson, Michael Linde Jakobsen, Maumita Chakrabarti, Harold Yura

The Aerospace Corporation

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

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Abstract

An analytical expression for the bias effect in digital speckle correlation is derived based on a Gaussian approximation of the spatial pixel size and array extent. The evaluation is carried out having assumed an incident speckle field. The analysis is focused on speckle displacements in the order of one pixel, thus having no speckle decorrelation. Furthermore, sensitivity is a main issue wherefore we need speckles close to the pixel size, which means that speckle averaging becomes important, and that Nyquist’s criteria may not be fulfilled. Based on these observations, a new correlation method is introduced, which alleviates the need to know the expected shape of the crosscovariance between the original and the off-set recorded speckle pattern. This concept calls for correlating the crosscovariance with the auto covariance, which essentially carries information on the expected shape of the crosscovariance.

Original language	English
Title of host publication	Proceedings of SPIE
Editors	Fernando Mendoza Santoyo
Number of pages	8
Volume	9660
Publisher	SPIE - International Society for Optical Engineering
Publication date	2015
Article number	96601J
DOIs	https://doi.org/10.1117/12.2195631
Publication status	Published - 2015
Event	SPECKLE 2015: VI International Conference on Speckle Metrology - Guanajuato, Mexico Duration: 24 Aug 2015 → 26 Aug 2015 Conference number: 6

Conference

Conference	SPECKLE 2015
Number	6
Country/Territory	Mexico
City	Guanajuato
Period	24/08/2015 → 26/08/2015

Series	Proceedings of SPIE - The International Society for Optical Engineering
ISSN	0277-786X

Bibliographical note

Copyright 2015 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

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title = "Finding small displacements of recorded speckle patterns: revisited",

abstract = "An analytical expression for the bias effect in digital speckle correlation is derived based on a Gaussian approximation of the spatial pixel size and array extent. The evaluation is carried out having assumed an incident speckle field. The analysis is focused on speckle displacements in the order of one pixel, thus having no speckle decorrelation. Furthermore, sensitivity is a main issue wherefore we need speckles close to the pixel size, which means that speckle averaging becomes important, and that Nyquist{\textquoteright}s criteria may not be fulfilled. Based on these observations, a new correlation method is introduced, which alleviates the need to know the expected shape of the crosscovariance between the original and the off-set recorded speckle pattern. This concept calls for correlating the crosscovariance with the auto covariance, which essentially carries information on the expected shape of the crosscovariance.",

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Hanson, SG, Jakobsen, ML, Chakrabarti, M & Yura, H 2015, Finding small displacements of recorded speckle patterns: revisited. in FM Santoyo (ed.), Proceedings of SPIE. vol. 9660, 96601J, SPIE - International Society for Optical Engineering, Proceedings of SPIE - The International Society for Optical Engineering, SPECKLE 2015, Guanajuato, Mexico, 24/08/2015. https://doi.org/10.1117/12.2195631

Finding small displacements of recorded speckle patterns: revisited. / Hanson, Steen Grüner; Jakobsen, Michael Linde; Chakrabarti, Maumita et al.
Proceedings of SPIE. ed. / Fernando Mendoza Santoyo. Vol. 9660 SPIE - International Society for Optical Engineering, 2015. 96601J (Proceedings of SPIE - The International Society for Optical Engineering).

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

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Finding small displacements of recorded speckle patterns: revisited

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