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FIB and TEM study on an anode/electrode interface in SOFC

  • Yi-Lin Liu
  • , C. Jiao

    Research output: Contribution to conference › Conference abstract for conference › Research

    Original languageEnglish
    Publication date2004
    Publication statusPublished - 2004
    Event13th European Microscopy Congress - Antwerp, Belgium
    Duration: 22 Aug 2004 → 27 Aug 2004

    Conference

    Conference13th European Microscopy Congress
    Country/TerritoryBelgium
    CityAntwerp
    Period22/08/2004 → 27/08/2004

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