Abstract
A fast, versatile, and non-destructive method for assessing biscuit quality is presented. The method integrates color (or browning) measurement, moisture assessment, compositional and dimensional measurements on a spectral imaging platform using the silicon range 400–1000 nm.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of 2017 Fifteenth IAPR International Conference on Machine Vision Applications |
| Publisher | IEEE |
| Publication date | 2017 |
| Pages | 502-505 |
| ISBN (Print) | 978-4-9011-2216-0 |
| DOIs | |
| Publication status | Published - 2017 |
| Event | Fifteenth IAPR International Conference on Machine Vision Applications - Nagoya University, Nagoya, Japan Duration: 8 May 2017 → 12 May 2017 Conference number: 15 |
Conference
| Conference | Fifteenth IAPR International Conference on Machine Vision Applications |
|---|---|
| Number | 15 |
| Location | Nagoya University |
| Country/Territory | Japan |
| City | Nagoya |
| Period | 08/05/2017 → 12/05/2017 |