Fast and direct measurements of the electrical properties of graphene using micro four-point probes

Mikkel Buster Klarskov, Henrik Friis Dam, Dirch Hjorth Petersen, Torben Michael Hansen, A Löwenborg, Tim Booth, Michael Stenbæk Schmidt, R Lin, P F Nielsen, Peter Bøggild

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    Abstract

    We present measurements of the electronic properties of graphene using a repositionable micro four-point probe system, which we show here to have unique advantages over measurements made on lithographically defined devices; namely speed, simplicity and lack of a need to pattern graphene. Measurements are performed in ambient, vacuum and controlled environmental conditions using an environmental scanning electron microscope (SEM). The results are comparable to previous results for microcleaved graphene on silicon dioxide (SiO2). We observe a pronounced hysteresis of the charge neutrality point, dependent on the sweep rate of the gate voltage; and environmental measurements provide insight into the sensor application prospects of graphene. The method offers a fast, local and non-destructive technique for electronic measurements on graphene, which can be positioned freely on a graphene flake.
    Original languageEnglish
    JournalNanotechnology
    Volume22
    Issue number44
    Pages (from-to)445702
    ISSN0957-4484
    DOIs
    Publication statusPublished - 2011

    Keywords

    • Condensed matter: structural, mechanical & thermal
    • Condensed matter: Condensed matter
    • Surfaces, interfaces and thin films

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