Abstract
Probabilities of excursions of random processes and fields into
critical domains are of fundamental interestin many civil
engineering decision problems. Examples are reliability
evaluations of structures subject torandom load processes, the
influence of the size of a structural element on the carrying
capacity of theelement when the local material properties vary as
a random field over the element, evaluation of the riskof floods
or draughts in connection with river and reservoir management,
etc. Only for some very few specialcases of process and field
models it is possible to obtain exact results for such
probabilities. However, dueto the engineering importance of the
problem, several approximate assessment methods have been
suggestedin the past. The suitability and accuracy of each of
these methods depends on the type of process or fieldunder
consideration. Often recourse must be taken to time consuming
simulation procedures. This paperrevives a conceptually simple
approach that gives surprisingly good results in particular for
wide band typesof random processes and fields. The closed form
formulas obtained for smooth Gaussian fieldsover rectangles
contain size effects both with respect to the area of the
rectangle and the side lengths of therectangle. Published rupture
stress data for plain concrete beams illustrate the applicability
of the derivedclosed form extreme value distributions as models
for distributions of rupture stresses related to weakest
linkmechanisms.
| Original language | English |
|---|---|
| Title of host publication | Probabilistic Mechanics and Structural Reliability |
| Publisher | American Society of Civil Engineers |
| Publication date | 2000 |
| Publication status | Published - 2000 |
| Event | 8th ASCE Joint Specialty Conference on Probabilistic Mechanics and Structural Reliability - University of Notre Dame, South Bend, United States Duration: 24 Jul 2000 → 26 Jul 2000 |
Conference
| Conference | 8th ASCE Joint Specialty Conference on Probabilistic Mechanics and Structural Reliability |
|---|---|
| Location | University of Notre Dame |
| Country/Territory | United States |
| City | South Bend |
| Period | 24/07/2000 → 26/07/2000 |
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