Extreme group index measured and calculated in 2D SOI-based photonic crystal waveguides

Andrei Lavrinenko, Rune Shim Jacobsen, Jacob Fage-Pedersen, Lars Hagedorn Frandsen, Beata Zsigri, Christophe Peucheret, Peter Ingo Borel

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Abstract

The paper reports on the measurement and evaluation of the group velocity (GV) dispersion in the proximity of the cutoff wavelength for the fundamental photonic bandgap mode in a 2D photonic crystal waveguide (PCW). The PCW is created by introducing a line defect in an otherwise perfect triangular lattice of air-holes in the 216-nm thick silicon layer in an SOI material. Experimental transmission spectra show a mode cut-off around 1562.5 nm for the fundamental photonic bandgap mode. In order to measure and model the group index of modes in the PCW, a time-of-flight (ToF) method is applied.
Original languageEnglish
Title of host publicationThe 18th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2005. LEOS 2005.
PublisherIEEE
Publication date2005
ISBN (Print)0-7803-9217-5
DOIs
Publication statusPublished - 2005
Event18th Annual Meeting of the IEEE Lasers and Electro-Optics Society - Sydney, Australia
Duration: 22 Oct 200528 Oct 2005
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=10387

Conference

Conference18th Annual Meeting of the IEEE Lasers and Electro-Optics Society
CountryAustralia
CitySydney
Period22/10/200528/10/2005
Internet address

Bibliographical note

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Cite this

Lavrinenko, A., Jacobsen, R. S., Fage-Pedersen, J., Frandsen, L. H., Zsigri, B., Peucheret, C., & Borel, P. I. (2005). Extreme group index measured and calculated in 2D SOI-based photonic crystal waveguides. In The 18th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2005. LEOS 2005. IEEE. https://doi.org/10.1109/LEOS.2005.1548008