Expanding the Nano- Toolbox for Electron Microscopy- Combining In-situ Nanomanipulation and Electron Beam Deposition

Research output: Contribution to journal › Conference article › Research › peer-review

Original language	English
Journal	Microscopy and Microanalysis
Volume	13(Suppl 2)
Pages (from-to)	1466-1467
ISSN	1431-9276
DOIs	https://doi.org/10.1017/S1431927607079172
Publication status	Published - 2007

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@inproceedings{94e0968ab7974178b7a9b40c62a37d50,

title = "Expanding the Nano- Toolbox for Electron Microscopy- Combining In-situ Nanomanipulation and Electron Beam Deposition",

author = "Kristian M{\o}lhave and Peter B{\o}ggild",

year = "2007",

doi = "10.1017/S1431927607079172",

language = "English",

volume = "13(Suppl 2)",

pages = "1466--1467",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

}

TY - GEN

T1 - Expanding the Nano- Toolbox for Electron Microscopy- Combining In-situ Nanomanipulation and Electron Beam Deposition

AU - Mølhave, Kristian

AU - Bøggild, Peter

PY - 2007

Y1 - 2007

U2 - 10.1017/S1431927607079172

DO - 10.1017/S1431927607079172

M3 - Conference article

SN - 1431-9276

VL - 13(Suppl 2)

SP - 1466

EP - 1467

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -