Evidence for a Nodeless Gap from the Superfluid Density of Optimally Doped Pr1.855Ce0.145CuO4-y Films

John A. Skinta, Thomas R. Lemberger , Tine Greibe, M. Natio

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

We present measurements of the ab-plane magnetic penetration depth, λ(T), in five optimally doped Pr1.855Ce0.145CuO4-y films for 1.6K≤TTc∼24K. Low resistivities, high superfluid densities ns(T)∝λ-2(T), high Tc’s, and small transition widths are reproducible and indicative of excellent film quality. For all five films, λ-2(T)/λ-2(0) at low T is well fitted by an exponential temperature dependence with a gap, Δmin, of 0.85kBTc. This behavior is consistent with a nodeless gap and is incompatible with d-wave superconductivity.

Original languageEnglish
Article number207003
JournalPhysical Review Letters
Volume88
Issue number20
Number of pages4
ISSN0031-9007
DOIs
Publication statusPublished - 2002
Externally publishedYes

Fingerprint Dive into the research topics of 'Evidence for a Nodeless Gap from the Superfluid Density of Optimally Doped <em>Pr<sub>1.855</sub>Ce<sub>0.145</sub>CuO<sub>4-y</sub></em> Films'. Together they form a unique fingerprint.

Cite this